An improved NMOS AC hot-carrier lifetime prediction algorithm based on the dominant degradation asymptote

1997 ◽  
Vol 44 (4) ◽  
pp. 651-658 ◽  
Author(s):  
S.W.A. Kim ◽  
B. Menberu ◽  
H.X.P. Le ◽  
Wenjie Jiang ◽  
J.E. Chung
Keyword(s):  
Carrier Lifetime ◽  
Lifetime Prediction ◽  
Prediction Algorithm ◽  
Hot Carrier

A Method of Hot Carrier Lifetime Prediction in Partially-Depleted Floating SOI NMOSFETs

1996 ◽  
Author(s):  
S. Maeda ◽  
Y. Yamaguchi ◽  
I.-J. Kim ◽  
H. O. Joachim ◽  
Y. Inoue ◽  
...  
Keyword(s):  
Carrier Lifetime ◽  
Lifetime Prediction ◽  
Hot Carrier

Impact of statistics on hot-carrier lifetime estimates of n-channel MOSFETs

1993 ◽  
Author(s):  
Eric S. Snyder ◽  
Ashish Kapoor ◽  
Clint Anderson
Keyword(s):  
Carrier Lifetime ◽  
Hot Carrier

The Effects of Offset Spacer on nMOSFET Hot-Carrier Lifetime

2019 ◽  
Vol 44 (1) ◽  
pp. 135-139 ◽  
Author(s):  
Junhong Feng ◽  
Zhenghao Gan ◽  
Lifei Zhang ◽  
Lifu Chang ◽  
Zicheng Pan ◽  
...  
Keyword(s):  
Carrier Lifetime ◽  
Hot Carrier

Mechanism and lifetime prediction method for hot-carrier-induced degradation in lateral diffused metal-oxide-semiconductor transistors

2008 ◽  
Vol 92 (24) ◽  
pp. 243501 ◽  
Author(s):  
Jone F. Chen ◽  
Kuen-Shiuan Tian ◽  
Shiang-Yu Chen ◽  
J. R. Lee ◽  
Kuo-Ming Wu ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Prediction Method ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Lifetime Prediction ◽  
Hot Carrier
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