(Invited) Characterization of Oxide Traps Participating in Random Telegraph Noise Using Charging History Effects in Nano-Scaled MOSFETs

2013 ◽  
Vol 58 (9) ◽  
pp. 265-279 ◽  
Author(s):  
T. Tsuchiya ◽  
N. Tamura ◽  
A. Sakakidani ◽  
K. Sonoda ◽  
M. Kamei ◽  
...  
Keyword(s):  
Random Telegraph Noise ◽  
History Effects ◽  
Telegraph Noise ◽  
Oxide Traps

Characterization of Random Telegraph Noise Generated by Process- and Cycling-Stress-Induced Traps in 26 nm NAND Flash Memory

2013 ◽  
Vol 52 (4S) ◽  
pp. 04CA07 ◽  
Author(s):  
Bong-Su Jo ◽  
Ho-Jung Kang ◽  
Sung-Min Joe ◽  
Min-Kyu Jeong ◽  
Kyung-Rok Han ◽  
...  
Keyword(s):  
Flash Memory ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Random Telegraph Noise ◽  
Telegraph Noise

Transistor-level characterization of static random access memory bit failures induced by random telegraph noise

2016 ◽  
Vol 55 (4S) ◽  
pp. 04ED05 ◽  
Author(s):  
Tomoko Mizutani ◽  
Takuya Saraya ◽  
Kiyoshi Takeuchi ◽  
Masaharu Kobayashi ◽  
Toshiro Hiramoto
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Access Memory ◽  
Random Telegraph Noise ◽  
Telegraph Noise

scholarly journals Dedicated random telegraph noise characterization of Ni/HfO2-based RRAM devices

2015 ◽  
Vol 147 ◽  
pp. 59-62 ◽  
Author(s):  
M.B. Gonzalez ◽  
J. Martin-Martinez ◽  
R. Rodriguez ◽  
M.C. Acero ◽  
M. Nafria ◽  
...  
Keyword(s):  
Random Telegraph Noise ◽  
Telegraph Noise ◽  
Noise Characterization

Systematic method for electrical characterization of random telegraph noise in MOSFETs

2017 ◽  
Vol 128 ◽  
pp. 115-120 ◽  
Author(s):  
Carlos Marquez ◽  
Noel Rodriguez ◽  
Francisco Gamiz ◽  
Akiko Ohata
Keyword(s):  
Electrical Characterization ◽  
Systematic Method ◽  
Random Telegraph Noise ◽  
Telegraph Noise
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