Experimental study of threshold voltage fluctuation due to statistical variation of channel dopant number in MOSFET's
1994 ◽
Vol 41
(11)
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pp. 2216-2221
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2012 ◽
Vol 12
(6)
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pp. 4485-4488
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2009 ◽
Vol 30
(3)
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pp. 243-245
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