Hole injection SiO/sub 2/ breakdown model for very low voltage lifetime extrapolation
1994 ◽
Vol 41
(5)
◽
pp. 761-767
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2007 ◽
Vol 46
(11)
◽
pp. 7487-7489
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2011 ◽
Vol 208
(10)
◽
pp. 2321-2324
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