A statistical model for integrated-circuit yield with clustered flaws

1988 ◽  
Vol 35 (4) ◽  
pp. 524-525 ◽  
Author(s):  
J. Shier
Keyword(s):  
Statistical Model ◽  
Integrated Circuit ◽  
Circuit Yield

Integrated circuit yield statistics

1983 ◽  
Vol 71 (4) ◽  
pp. 453-470 ◽  
Author(s):  
C.H. Stapper ◽  
F.M. Armstrong ◽  
K. Saji
Keyword(s):  
Integrated Circuit ◽  
Circuit Yield

On Murphy’s Integrated Circuit Yield Integral

1995 ◽  
Vol 117 (2) ◽  
pp. 159-164
Author(s):  
John H. Lau
Keyword(s):  
Density Distribution ◽  
Closed Form ◽  
Integrated Circuit ◽  
Defect Density ◽  
Closed Form Solution ◽  
Form Solution ◽  
Simple Equation ◽  
Multichip Module ◽  
Yield Formula ◽  
Circuit Yield

An approximated closed-form integrated circuit (IC) yield formula based on a Gaussian defect density distribution for the compounder in Murphy’s yield integral is presented. Also, a closed-form solution for the average number of faults (AD0) in an IC is obtained for a given IC yield (Y). Furthermore, based on the new IC yield formula a simple equation for determining the number of yielded chips in a wafer is given. Finally, the multichip module yield (Ym) and resultant shipped multichip module yield (Yms) based on the new IC yield formula are provided.

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