On Murphy’s Integrated Circuit Yield Integral
Keyword(s):
An approximated closed-form integrated circuit (IC) yield formula based on a Gaussian defect density distribution for the compounder in Murphy’s yield integral is presented. Also, a closed-form solution for the average number of faults (AD0) in an IC is obtained for a given IC yield (Y). Furthermore, based on the new IC yield formula a simple equation for determining the number of yielded chips in a wafer is given. Finally, the multichip module yield (Ym) and resultant shipped multichip module yield (Yms) based on the new IC yield formula are provided.
Keyword(s):
2013 ◽
Vol 40
(2)
◽
pp. 106-114
2000 ◽
Vol 19
(4)
◽
pp. 278-291
◽
Keyword(s):
Keyword(s):
2021 ◽
pp. 1-10