Characterization of crosstalk noise in submicron CMOS integrated circuits: an experimental view

1998 ◽  
Vol 40 (3) ◽  
pp. 271-280 ◽  
Author(s):  
J.-Y. Fourniols ◽  
M. Roca ◽  
F. Caignet ◽  
E. Sicard
Keyword(s):  
Integrated Circuits ◽  
Cmos Integrated Circuits ◽  
Crosstalk Noise ◽  
Submicron Cmos

An SEM based system for a complete characterization of latch-up in CMOS integrated circuits

Scanning ◽  
1986 ◽  
Vol 8 (1) ◽  
pp. 20-33 ◽  
Author(s):  
C. Canali ◽  
F. Fantini ◽  
M. Giannini ◽  
A. Senin ◽  
M. Vanzi ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Complete Characterization ◽  
Cmos Integrated Circuits ◽  
Latch Up

Optical Failure Analysis Technique in Deep Submicron CMOS Integrated Circuits

2011 ◽  
Vol 11 (4) ◽  
pp. 302-308
Author(s):  
Sunk-Won Kim ◽  
Hyong-Min Lee ◽  
Hyun-Joong Lee ◽  
Jong-Kwan Woo ◽  
Jun-Ho Cheon ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Failure Analysis ◽  
Deep Submicron ◽  
Cmos Integrated Circuits ◽  
Analysis Technique ◽  
Submicron Cmos
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