An SEM based system for a complete characterization of latch-up in CMOS integrated circuits

Scanning ◽  
1986 ◽  
Vol 8 (1) ◽  
pp. 20-33 ◽  
Author(s):  
C. Canali ◽  
F. Fantini ◽  
M. Giannini ◽  
A. Senin ◽  
M. Vanzi ◽  
...  
1979 ◽  
Vol 26 (6) ◽  
pp. 5065-5068 ◽  
Author(s):  
A. Ochoa ◽  
W. Dawes ◽  
D. Estreich

1973 ◽  
Vol 20 (6) ◽  
pp. 293-299 ◽  
Author(s):  
B. L. Gregory ◽  
B. D. Shafer

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