An SEM based system for a complete characterization of latch-up in CMOS integrated circuits
1998 ◽
Vol 40
(3)
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pp. 271-280
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2019 ◽
Vol 66
(4)
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pp. 1648-1655
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Keyword(s):
1982 ◽
Vol 1
(4)
◽
pp. 157-162
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1979 ◽
Vol 26
(6)
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pp. 5065-5068
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1973 ◽
Vol 20
(6)
◽
pp. 293-299
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1994 ◽
Vol 30
(2)
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pp. 350-357
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2004 ◽
Vol 518
(1-2)
◽
pp. 357-361
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