A simulator for at-speed robust testing of path delay faults in combinational circuits

Yuan-Chieh Hsu; S.K. Gupta

doi:10.1109/12.544489

A simulator for at-speed robust testing of path delay faults in combinational circuits

IEEE Transactions on Computers ◽

10.1109/12.544489 ◽

1996 ◽

Vol 45 (11) ◽

pp. 1312-1318 ◽

Cited By ~ 6

Author(s):

Yuan-Chieh Hsu ◽

S.K. Gupta

Keyword(s):

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults ◽

Robust Testing

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A satisfiability-based test generator for path delay faults in combinational circuits

33rd Design Automation Conference Proceedings, 1996 ◽

10.1109/dac.1996.545574 ◽

2005 ◽

Cited By ~ 30

Author(s):

Chih-Ang Chen ◽

S.K. Gupta

Keyword(s):

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults

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NEST: a nonenumerative test generation method for path delay faults in combinational circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.476581 ◽

1995 ◽

Vol 14 (12) ◽

pp. 1505-1515 ◽

Cited By ~ 30

Author(s):

I. Pomeranz ◽

S.M. Reddy ◽

P. Uppaluri

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults

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A method to derive compact test sets for path delay faults in combinational circuits

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470630 ◽

2002 ◽

Cited By ~ 27

Author(s):

J. Saxena ◽

D.K. Pradhan

Keyword(s):

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults ◽

Test Sets ◽

Compact Test

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An efficient automatic test generation system for path delay faults in combinational circuits

Proceedings of the 8th International Conference on VLSI Design ◽

10.1109/icvd.1995.512097 ◽

2002 ◽

Cited By ~ 12

Author(s):

A.K. Majhi ◽

J. Jacob ◽

L.M. Patnaik ◽

V.D. Agrawal

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults ◽

Generation System ◽

Automatic Test Generation ◽

Automatic Test

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Design-for-testability for path delay faults in large combinational circuits using test points

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.703823 ◽

1998 ◽

Vol 17 (4) ◽

pp. 333-343 ◽

Cited By ~ 29

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Design For Testability ◽

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults ◽

Test Points

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Test generation for primitive path delay faults in combinational circuits

Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) ICCAD-97 ◽

10.1109/iccad.1997.643605 ◽

1997 ◽

Cited By ~ 15

Author(s):

Tekumalla ◽

Menon

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults

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A satisfiability-based test generator for path delay faults in combinational circuits

33rd Design Automation Conference Proceedings, 1996 ◽

10.1145/240518.240557 ◽

1996 ◽

Cited By ~ 2

Author(s):

Chih-Ang Chen ◽

Sandeep K. Gupta

Keyword(s):

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults

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Parallel pattern fault simulation of path delay faults

Proceedings of the 1989 26th ACM/IEEE conference on Design automation conference - DAC '89 ◽

10.1145/74382.74442 ◽

1989 ◽

Cited By ~ 46

Author(s):

M. Schulz ◽

F. Fink ◽

K. Fuchs

Keyword(s):

Fault Simulation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Parallel Pattern

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Fast test pattern generation for all path delay faults considering various test classes

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246529 ◽

2002 ◽

Cited By ~ 15

Author(s):

K. Fuchs ◽

H.C. Wittmann ◽

K.J. Antreich

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults

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Functional-based ATPG for path delay faults

2000 Southwest Symposium on Mixed-Signal Design (Cat. No.00EX390) ◽

10.1109/ssmsd.2000.836465 ◽

2002 ◽

Cited By ~ 1

Author(s):

M. Michael ◽

S. Tragoudas

Keyword(s):

Delay Faults ◽

Path Delay ◽

Path Delay Faults

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