A numerical method for the determination of the transient response of semiconductor devices

1985 ◽  
Vol 2 (4) ◽  
pp. 314-318
Author(s):  
P.D. Griffin ◽  
J. Marques
Author(s):  
Romain Desplats ◽  
Timothee Dargnies ◽  
Jean-Christophe Courrege ◽  
Philippe Perdu ◽  
Jean-Louis Noullet

Abstract Focused Ion Beam (FIB) tools are widely used for Integrated Circuit (IC) debug and repair. With the increasing density of recent semiconductor devices, FIB operations are increasingly challenged, requiring access through 4 or more metal layers to reach a metal line of interest. In some cases, accessibility from the front side, through these metal layers, is so limited that backside FIB operations appear to be the most appropriate approach. The questions to be resolved before starting frontside or backside FIB operations on a device are: 1. Is it do-able, are the metal lines accessible? 2. What is the optimal positioning (e.g. accessing a metal 2 line is much faster and easier than digging down to a metal 6 line)? (for the backside) 3. What risk, time and cost are involved in FIB operations? In this paper, we will present a new approach, which allows the FIB user or designer to calculate the optimal FIB operation for debug and IC repair. It automatically selects the fastest and easiest milling and deposition FIB operations.


1983 ◽  
Vol 48 (5) ◽  
pp. 1358-1367 ◽  
Author(s):  
Antonín Tockstein ◽  
František Skopal

A method for constructing curves is proposed that are linear in a wide region and from whose slopes it is possible to determine the rate constant, if a parameter, θ, is calculated numerically from a rapidly converging recurrent formula or from its explicit form. The values of rate constants and parameter θ thus simply found are compared with those found by an optimization algorithm on a computer; the deviations do not exceed ±10%.


2021 ◽  
Vol 160 ◽  
pp. 104291
Author(s):  
Andreas Beinstingel ◽  
Michael Keller ◽  
Michael Heider ◽  
Burkhard Pinnekamp ◽  
Steffen Marburg

2017 ◽  
Vol 33 (8) ◽  
pp. 2673-2683
Author(s):  
Vera Hofer ◽  
Johannes Leitner ◽  
Horst Lewitschnig ◽  
Thomas Nowak

BIOMATH ◽  
2016 ◽  
Vol 5 (1) ◽  
pp. 1604231
Author(s):  
A.N. Pete ◽  
Peter Mathye ◽  
Igor Fedotov ◽  
Michael Shatalov

An inverse numerical method that estimate parameters of dynamic mathematical models given some information about unknown trajectories at some time is applied to examples taken from Biology and Ecology. The method consisting of determining an over-determined system of algebraic equations using experimental data. The solution of the over-determined system is then obtained using, for example the least-squares method. To illustrate the effectiveness of the method an analysis of examples and corresponding numerical example are presented.


2004 ◽  
Vol 03 (01) ◽  
pp. 91-102 ◽  
Author(s):  
PONMILE OLOYEDE ◽  
GENNADY MIL'NIKOV ◽  
HIROKI NAKAMURA

This paper presents a numerical method which locates caustics of classical trajectories on-the-fly. The method is conceptually simple and is applicable to a system of arbitrary dimensions. The efficiency of the method is demonstrated by determining caustics of trajectories in the 2-D Henon–Heiles potential and of trajectories used to simulate a triatomic reaction process for J (total angular momentum) = 0.


Sign in / Sign up

Export Citation Format

Share Document