Determination of an initial mesh for computer simulation of semiconductor devices with nearly abrupt junctions

1976 ◽  
Vol 12 (19) ◽  
pp. 505 ◽  
Author(s):  
R.J. Bennett ◽  
K.A. Thoma
Keyword(s):  
Computer Simulation ◽  
Semiconductor Devices ◽  
Initial Mesh

Determination of an initial mesh for computer simulation of H-abrupt devices

1981 ◽  
Vol 17 (20) ◽  
pp. 747
Author(s):  
R.J. Bennett ◽  
K.A. Thoma
Keyword(s):  
Computer Simulation ◽  
Initial Mesh

Automatic Determination of Optimal FIB Operations for Improved Circuit Probing and Fast Reconfiguration

2000 ◽  
Author(s):  
Romain Desplats ◽  
Timothee Dargnies ◽  
Jean-Christophe Courrege ◽  
Philippe Perdu ◽  
Jean-Louis Noullet
Keyword(s):  
Integrated Circuit ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Semiconductor Devices ◽  
Front Side ◽  
Automatic Determination ◽  
Metal Line ◽  
New Approach ◽  
Metal Layers

Abstract Focused Ion Beam (FIB) tools are widely used for Integrated Circuit (IC) debug and repair. With the increasing density of recent semiconductor devices, FIB operations are increasingly challenged, requiring access through 4 or more metal layers to reach a metal line of interest. In some cases, accessibility from the front side, through these metal layers, is so limited that backside FIB operations appear to be the most appropriate approach. The questions to be resolved before starting frontside or backside FIB operations on a device are: 1. Is it do-able, are the metal lines accessible? 2. What is the optimal positioning (e.g. accessing a metal 2 line is much faster and easier than digging down to a metal 6 line)? (for the backside) 3. What risk, time and cost are involved in FIB operations? In this paper, we will present a new approach, which allows the FIB user or designer to calculate the optimal FIB operation for debug and IC repair. It automatically selects the fastest and easiest milling and deposition FIB operations.

scholarly journals Determination of Left Ventricular End Diastolic Pressure Utilizing Non-Invasive Techniques: A Computer Simulation Study

2016 ◽  
Vol 22 (8) ◽  
pp. S43-S44
Author(s):  
Ying Sun ◽  
Toby Steinberg ◽  
Jeremy Rier ◽  
Stewart Benton ◽  
Daniel Steinberg ◽  
...  
Keyword(s):  
Computer Simulation ◽  
Simulation Study ◽  
Diastolic Pressure ◽  
Left Ventricular ◽  
Computer Simulation Study ◽  
Non Invasive ◽  
Invasive Techniques

Analytic Determination of Slip and Efficiencies of Rolling Contact C.V.T.’s With Experimental Verifications

1986 ◽  
Vol 108 (1) ◽  
pp. 72-76 ◽  
Author(s):  
J. Modrey ◽  
Y. K. Younes
Keyword(s):  
Computer Simulation ◽  
Rolling Contact ◽  
Analytic Determination ◽  
Continuously Variable Transmissions ◽  
Fluid Properties ◽  
Good Guide ◽  
Parallel Tests

Rolling contact continuously variable transmissions (C.V.T.) transmit forces through a highly viscous spot between rolling-slipping contacts. The mechanics of the spot are characterized by complex elastohydrodynamic conditions and fluid properties only partially determinable at the extreme pressures of operation. A computer simulation of the spot mechanics based on extensions of research in less complex elastohydrodynamic situations was developed. Comparisons with parallel tests on a commercial C. V. T. verify that the simulation described in a good guide to design of this class of transmissions.

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