scholarly journals Effects of 3dand 4dtransition metal substitutional impurities on the electronic properties of CrO2

2012 ◽  
Vol 86 (23) ◽  
Author(s):  
M. E. Williams ◽  
H. Sims ◽  
D. Mazumdar ◽  
W. H. Butler
2016 ◽  
Vol 18 (31) ◽  
pp. 21913-21920 ◽  
Author(s):  
Tomás Alonso-Lanza ◽  
Andrés Ayuela ◽  
Faustino Aguilera-Granja

We describe the structural and electronic properties of graphene doped with substitutional impurities of 4d and 5d transition metals.


Nanoscale ◽  
2017 ◽  
Vol 9 (32) ◽  
pp. 11619-11624 ◽  
Author(s):  
Dan Wang ◽  
Xian-Bin Li ◽  
Hong-Bo Sun

The electronic properties of native and substitutional defects in monolayer InSe, including formation energies and ionization energies are explored systematically. Also, the possible doping strategy for conductivity is proposed.


2020 ◽  
Vol 102 (13) ◽  
Author(s):  
Saif Ullah ◽  
Pablo A. Denis ◽  
Marcos G. Menezes ◽  
Fernando Sato ◽  
Rodrigo B. Capaz

2015 ◽  
Vol 106 (19) ◽  
pp. 192102 ◽  
Author(s):  
G. Alfieri ◽  
T. Tsutsumi ◽  
R. Micheletto

Author(s):  
J.M. Bonar ◽  
R. Hull ◽  
R. Malik ◽  
R. Ryan ◽  
J.F. Walker

In this study we have examined a series of strained heteropeitaxial GaAs/InGaAs/GaAs and InGaAs/GaAs structures, both on (001) GaAs substrates. These heterostructures are potentially very interesting from a device standpoint because of improved band gap properties (InAs has a much smaller band gap than GaAs so there is a large band offset at the InGaAs/GaAs interface), and because of the much higher mobility of InAs. However, there is a 7.2% lattice mismatch between InAs and GaAs, so an InxGa1-xAs layer in a GaAs structure with even relatively low x will have a large amount of strain, and misfit dislocations are expected to form above some critical thickness. We attempt here to correlate the effect of misfit dislocations on the electronic properties of this material.The samples we examined consisted of 200Å InxGa1-xAs layered in a hetero-junction bipolar transistor (HBT) structure (InxGa1-xAs on top of a (001) GaAs buffer, followed by more GaAs, then a layer of AlGaAs and a GaAs cap), and a series consisting of a 200Å layer of InxGa1-xAs on a (001) GaAs substrate.


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