scholarly journals X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in multilayered systems. II. Diffuse scattering

2003 ◽  
Vol 68 (22) ◽  
Author(s):  
D. R. Lee ◽  
S. K. Sinha ◽  
C. S. Nelson ◽  
J. C. Lang ◽  
C. T. Venkataraman ◽  
...  
Keyword(s):  
Diffuse Scattering ◽  
Magnetic Scattering ◽  
X Ray ◽  
Multilayered Systems ◽  
Rough Interfaces

Bragg diffraction peaks in x-ray diffuse scattering from multilayers with rough interfaces

1995 ◽  
Vol 52 (23) ◽  
pp. 16369-16372 ◽  
Author(s):  
V. M. Kaganer ◽  
S. A. Stepanov ◽  
R. Köhler
Keyword(s):  
Diffuse Scattering ◽  
Bragg Diffraction ◽  
X Ray ◽  
Diffraction Peaks ◽  
Rough Interfaces

scholarly journals Reproducibility of protein x-ray diffuse scattering and potential utility for modeling atomic displacement parameters

2021 ◽  
Vol 8 (4) ◽  
pp. 044701
Author(s):  
Zhen Su ◽  
Medhanjali Dasgupta ◽  
Frédéric Poitevin ◽  
Irimpan I. Mathews ◽  
Henry van den Bedem ◽  
...  
Keyword(s):  
Diffuse Scattering ◽  
Atomic Displacement ◽  
Potential Utility ◽  
X Ray ◽  
Protein X ◽  
Atomic Displacement Parameters

Evolution of Interfacial Roughness Correlations of Fe Au Films Grown on Mgo(001) Substrates

1996 ◽  
Vol 440 ◽  
Author(s):  
P. C. Chow ◽  
R. Paniago ◽  
R. Forrest ◽  
S. C. Moss ◽  
S. S. P. Parkin ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffuse Scattering ◽  
Perfect Match ◽  
Grazing Incidence ◽  
Interface Roughness ◽  
Metallic Structures ◽  
X Ray ◽  
Dimensional Image ◽  
X Ray Scattering ◽  
Image Plate Detector

AbstractThe growth by sputtering of a series of thin films of Fe/Au on MgO(001) substrates was analyzed using Bragg and diffuse X-ray scattering. The Fe (bcc) layer grows rotated by 45° with respect to the MgO – Au(fcc) (001) epitaxial orientation, resulting in an almost perfect match between the two metallic structures. By collecting the X-ray diffuse scattering under grazing incidence using a 2-dimensional image plate detector, we mapped the reciprocal space of these films. We characterized the correlated interface roughness starting with a buffer of Fe in which only three interfaces are present. The propagation of the roughness was subsequently characterized for Fe/Au multilayers with 40 and 100 bilayers. We observe an enlargement of the surface features as a function of time, evidenced by the longer lateral cutoff length measured for thicker films.

scholarly journals Crystal symmetry lowering in chiral multiferroic Ba3TaFe3Si2O14 observed by x-ray magnetic scattering

2017 ◽  
Vol 95 (20) ◽  
Author(s):  
M. Ramakrishnan ◽  
Y. Joly ◽  
Y. W. Windsor ◽  
L. Rettig ◽  
A. Alberca ◽  
...  
Keyword(s):  
Crystal Symmetry ◽  
Magnetic Scattering ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document