Grazing-incidence X-ray diffraction from multilayers, taking into account diffuse scattering from rough interfaces

1998 ◽  
Vol 66 (2) ◽  
pp. 193-199 ◽  
Author(s):  
A. Ulyanenkov
Keyword(s):  
Diffuse Scattering ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Rough Interfaces

X-Ray Diffraction Study of the Phase Transition of the ${\rm Si}(111)(\sqrt{3} \times \sqrt{3})\mbox{-Ag}$ Surface

2003 ◽  
Vol 10 (02n03) ◽  
pp. 519-524 ◽  
Author(s):  
Toshio Takahashi ◽  
Hiroo Tajiri ◽  
Kazushi Sumitani ◽  
Koichi Akimoto ◽  
Hiroshi Sugiyama ◽  
...  
Keyword(s):  
Phase Transition ◽  
Transition Temperature ◽  
Low Temperatures ◽  
Diffuse Scattering ◽  
Room Temperature ◽  
Bragg Reflection ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Displacive Phase Transition

The structure of the [Formula: see text] surface was studied at both room temperature and a low temperature of 50 K using grazing incidence X-ray diffraction. At low temperatures diffuse scattering was observed in addition to Bragg reflection. Least squares analyses for Bragg reflections using anisotropic Debye–Waller factors show that the structure at 50 K is consistent with an inequivalent triangle (IET) model, while the structure at room temperature is explained by a honeycomb-chained triangle (HCT) model with strong anisotropic Debye–Waller factors. From the temperature dependence of diffuse scattering, the phase transition temperature Tc and critical exponent β were determined to be about 150 K and 0.27. Some Bragg intensities showed discontinuous changes in their first derivatives at Tc. The results favor a displacive phase transition rather than an order–disorder one.

Grazing incidence x-ray diffraction at free-standing nanoscale islands: fine structure of diffuse scattering

2003 ◽  
Vol 36 (10A) ◽  
pp. A225-A230 ◽  
Author(s):  
D Grigoriev ◽  
M Hanke ◽  
M Schmidbauer ◽  
P Sch fer ◽  
O Konovalov ◽  
...  
Keyword(s):  
Fine Structure ◽  
Diffuse Scattering ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Free Standing ◽  
X Ray

Diffuse scattering from interface roughness in grazing-incidence x-ray diffraction

1996 ◽  
Vol 54 (11) ◽  
pp. 8150-8162 ◽  
Author(s):  
S. A. Stepanov ◽  
E. A. Kondrashkina ◽  
M. Schmidbauer ◽  
R. Köhler ◽  
J.-U. Pfeiffer ◽  
...  
Keyword(s):  
Diffuse Scattering ◽  
Grazing Incidence ◽  
Interface Roughness ◽  
X Ray Diffraction ◽  
X Ray

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

scholarly journals Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3191
Author(s):  
Arun Kumar Mukhopadhyay ◽  
Avishek Roy ◽  
Gourab Bhattacharjee ◽  
Sadhan Chandra Das ◽  
Abhijit Majumdar ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Relative Composition ◽  
Transmission Electron ◽  
Deposited Film ◽  
Deposited Films

We report the surface stoichiometry of Tix-CuyNz thin film as a function of film depth. Films are deposited by high power impulse (HiPIMS) and DC magnetron sputtering (DCMS). The composition of Ti, Cu, and N in the deposited film is investigated by X-ray photoelectron spectroscopy (XPS). At a larger depth, the relative composition of Cu and Ti in the film is increased compared to the surface. The amount of adventitious carbon which is present on the film surface strongly decreases with film depth. Deposited films also contain a significant amount of oxygen whose origin is not fully clear. Grazing incidence X-ray diffraction (GIXD) shows a Cu3N phase on the surface, while transmission electron microscopy (TEM) indicates a polycrystalline structure and the presence of a Ti3CuN phase.

Evolution of Interfacial Roughness Correlations of Fe Au Films Grown on Mgo(001) Substrates

1996 ◽  
Vol 440 ◽  
Author(s):  
P. C. Chow ◽  
R. Paniago ◽  
R. Forrest ◽  
S. C. Moss ◽  
S. S. P. Parkin ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffuse Scattering ◽  
Perfect Match ◽  
Grazing Incidence ◽  
Interface Roughness ◽  
Metallic Structures ◽  
X Ray ◽  
Dimensional Image ◽  
X Ray Scattering ◽  
Image Plate Detector

AbstractThe growth by sputtering of a series of thin films of Fe/Au on MgO(001) substrates was analyzed using Bragg and diffuse X-ray scattering. The Fe (bcc) layer grows rotated by 45° with respect to the MgO – Au(fcc) (001) epitaxial orientation, resulting in an almost perfect match between the two metallic structures. By collecting the X-ray diffuse scattering under grazing incidence using a 2-dimensional image plate detector, we mapped the reciprocal space of these films. We characterized the correlated interface roughness starting with a buffer of Fe in which only three interfaces are present. The propagation of the roughness was subsequently characterized for Fe/Au multilayers with 40 and 100 bilayers. We observe an enlargement of the surface features as a function of time, evidenced by the longer lateral cutoff length measured for thicker films.

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