ANISOTROPIC CRITICAL X-RAY DIFFUSE SCATTERING FROM KMnF3 AND NaNbO3 SINGLE CRYSTALS

1972 ◽  
Vol 33 (C2) ◽  
pp. C2-132-C2-132
Author(s):  
F. DENOYER ◽  
M. LAMBERT
Keyword(s):  
Single Crystals ◽  
Diffuse Scattering ◽  
X Ray

X-Ray Reflectivity Study of Single- and Bicrystals of Gold

1990 ◽  
Vol 208 ◽  
Author(s):  
M. R. Fitzsimmons ◽  
E. Burkel ◽  
J. Peisl
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Single Crystals ◽  
Diffuse Scattering ◽  
Direct Evidence ◽  
X Ray ◽  
Specular Reflectivity ◽  
Boundary Measurements

ABSTRACTX-ray reflectivity techniques have been used to characterize the surfaces of 0.4µm thick Au films epitaxially grown on single-crystals of NaCl. Measurements of both the specular and non-specular reflectivity suggest that the Au surface is very rough. The nonspecular reflectivity provides valuable information about the correlation of the heights at different points on the surface. The first in situ reflectivity study of the formation and destruction of a grain boundary shows direct evidence for the existence of diffuse scattering from the grain boundary. Measurements of several [0011 twist grain boundaries suggest that the roughness and texture of an interface depends upon the geometrical orientation of the surrounding substrates.

X-ray diffuse scattering observations for Sr x Ba1−x Nb2O6 single crystals with x=0.35 and 0.81

2018 ◽  
Vol 91 (9-10) ◽  
pp. 969-975 ◽  
Author(s):  
M. Paściak ◽  
M. Kopecký ◽  
J. Kub ◽  
J. Fábry ◽  
J. Dec ◽  
...  
Keyword(s):  
Single Crystals ◽  
Diffuse Scattering ◽  
X Ray

Practical Aspects of Removing the Effects of Elastic and Thermal Diffuse Scattering from Spectroscopic Data for Single Crystals

2014 ◽  
Vol 20 (4) ◽  
pp. 1078-1089 ◽  
Author(s):  
Nathan R. Lugg ◽  
Melissa J. Neish ◽  
Scott D. Findlay ◽  
Leslie J. Allen
Keyword(s):  
Factor Analysis ◽  
Energy Loss ◽  
Single Crystals ◽  
Electron Energy ◽  
Diffuse Scattering ◽  
Energy Dispersive ◽  
Thermal Diffuse Scattering ◽  
X Ray ◽  
Electron Energy Loss ◽  
Thermal Diffuse

AbstractA method to remove the effects of elastic and thermal diffuse scattering (TDS) of the incident electron probe from electron energy-loss and energy-dispersive X-ray spectroscopy data for atomically resolved spectrum images of single crystals of known thickness is presented. By calculating the distribution of the probe within a specimen of known structure, it is possible to deconvolve the channeling of the probe and TDS from experimental data by reformulating the inelastic cross-section as an inverse problem. In electron energy-loss spectroscopy this allows valid comparisons with first principles fine-structure calculations to be made. In energy-dispersive X-ray spectroscopy, direct compositional analyses such as ζ-factor and Cliff–Lorimer k-factor analysis can be performed without the complications of channeling and TDS. We explore in detail how this method can be incorporated into existing multislice programs, and demonstrate practical considerations in implementing this method using a simulated test specimen. We show the importance of taking into account the scattering of the probe in k-factor analysis in a zone axis orientation. The applicability and limitations of the method are discussed.

Evidence of Forbidden Reflections in the Diffuse Scattering of Hg0.80Cd0.20Te Single Crystals

1990 ◽  
Vol 209 ◽  
Author(s):  
J. P. Quintana
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Diffuse Scattering ◽  
Anomalous Dispersion ◽  
Scattering Pattern ◽  
X Ray ◽  
Zinc Blende ◽  
Zinc Blende Structure

ABSTRACTThe x-ray diffuse scattering pattern from a commercial bulk n-type Hg0.80Cd0.20Te single crystal was measured in absolute units. Anomalous dispersion techniques near the Hg LIII edge were used to determine theintensity due to Hg interactions. Diffuse x-ray superlattice reflections are reported that are forbidden by the zinc-blende structure. The systematic absences in these peaks eliminate the possibility that they are the result of a Cu3Au ordering scheme.

X-Ray Attenuation in Silicon and Germanium in the Energy Range 25 to 50 keV

1977 ◽  
Vol 32 (6) ◽  
pp. 588-593 ◽  
Author(s):  
L. Gerward ◽  
G. Thuesen
Keyword(s):  
Energy Range ◽  
Single Crystals ◽  
Diffuse Scattering ◽  
Theoretical Calculations ◽  
Photoelectric Absorption ◽  
Attenuation Coefficients ◽  
Thermal Diffuse Scattering ◽  
X Ray ◽  
Silicon And Germanium ◽  
Thermal Diffuse

Abstract The X-ray attenuation coefficients of silicon and germanium single crystals have been measured using an energy-dispersive method with particular emphasis on the energy range 25 to 50 keV. The experimental results are compared with theoretical calculations of the photoelectric absorption as well as the attenuation due to the Compton scattering and thermal diffuse scattering.

X-ray diffuse scattering of quenched copper single crystals

1995 ◽  
Vol 97 (1-4) ◽  
pp. 491-494
Author(s):  
Hiroshi Maeta ◽  
Kohji Yamakawa ◽  
Norimasa Matsumoto ◽  
Katsuji Haruna ◽  
Teruo Kato ◽  
...  
Keyword(s):  
Single Crystals ◽  
Diffuse Scattering ◽  
X Ray ◽  
Copper Single Crystals
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