Accuracy of alloy partial densities of states as determined by valence-band photoelectron diffraction

1995 ◽  
Vol 51 (15) ◽  
pp. 9497-9507 ◽  
Author(s):  
A. Stuck ◽  
J. Osterwalder ◽  
T. Greber ◽  
L. Schlapbach ◽  
R. C. Albers ◽  
...  
2002 ◽  
Vol 09 (02) ◽  
pp. 883-888 ◽  
Author(s):  
G. H. FECHER ◽  
J. BRAUN ◽  
A. OELSNER ◽  
CH. OSTERTAG ◽  
G. SCHÖNHENSE

The angular dependence of the circular dichroism in photoemission from Pt(111) was investigated for excitation with VUV and soft X-ray radiation. VUV excitation was used to probe band structure and the circular dichroism for valence band emission. The measurements are compared to full relativistic single step photoemission calculations. XPS was used to investigate the circular dichroism in emission from the 4f core level. In this case, the dichroism is induced by photoelectron diffraction. First results from single step core level calculations are compared to the experimental observations.


2005 ◽  
Vol 98 (1) ◽  
pp. 013704 ◽  
Author(s):  
L. Zhang ◽  
I. Konovalov ◽  
D. Wett ◽  
D. Schulze ◽  
R. Szargan ◽  
...  

1990 ◽  
Vol 64 (22) ◽  
pp. 2683-2686 ◽  
Author(s):  
J. Osterwalder ◽  
T. Greber ◽  
S. Hüfner ◽  
L. Schlapbach

1993 ◽  
Vol 297 ◽  
Author(s):  
JoŽE Furlan ◽  
Franc Smole ◽  
Pavle PopoviĆ

Effective densities of states in conduction and valence band, Nc and Nv, are usually set to a fixed value of 1019 to 1020 cm−3 in all computer simulations of a-Si structures. In this contribution the densities Nc and Nv are analytically expressed for different selected extended states distributions. The derivatives d(lnNc)/dx and d(lnNv)/dx, representing specific terms in transport equations, are expressed as function of position dependent band structure. The effect of an increased disorder in heterojunction is simulated by Gaussian distribution of states in a linearly graded heterojunction region.


1974 ◽  
Vol 9 (2) ◽  
pp. 600-621 ◽  
Author(s):  
L. Ley ◽  
R. A. Pollak ◽  
F. R. McFeely ◽  
S. P. Kowalczyk ◽  
D. A. Shirley

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