X-ray photoelectron diffraction from a free-electron-metal valence band: Evidence for hole-state localization

1990 ◽  
Vol 64 (22) ◽  
pp. 2683-2686 ◽  
Author(s):  
J. Osterwalder ◽  
T. Greber ◽  
S. Hüfner ◽  
L. Schlapbach
Keyword(s):  
Valence Band ◽  
Free Electron ◽  
Hole State ◽  
X Ray ◽  
Photoelectron Diffraction

DICHROISM IN ANGLE-RESOLVED PHOTOEMISSION FROM Pt(111)

2002 ◽  
Vol 09 (02) ◽  
pp. 883-888 ◽  
Author(s):  
G. H. FECHER ◽  
J. BRAUN ◽  
A. OELSNER ◽  
CH. OSTERTAG ◽  
G. SCHÖNHENSE
Keyword(s):  
Circular Dichroism ◽  
Band Structure ◽  
Valence Band ◽  
Single Step ◽  
Core Level ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Band Emission ◽  
First Results ◽  
Circular Dichroïsm

The angular dependence of the circular dichroism in photoemission from Pt(111) was investigated for excitation with VUV and soft X-ray radiation. VUV excitation was used to probe band structure and the circular dichroism for valence band emission. The measurements are compared to full relativistic single step photoemission calculations. XPS was used to investigate the circular dichroism in emission from the 4f core level. In this case, the dichroism is induced by photoelectron diffraction. First results from single step core level calculations are compared to the experimental observations.

scholarly journals Photoelectron Diffraction Imaging of a Molecular Breakup Using an X-Ray Free-Electron Laser

2020 ◽  
Vol 10 (2) ◽  
Author(s):  
Gregor Kastirke ◽  
Markus S. Schöffler ◽  
Miriam Weller ◽  
Jonas Rist ◽  
Rebecca Boll ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Diffraction Imaging

scholarly journals Photoelectron diffraction from laser-aligned molecules with X-ray free-electron laser pulses

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Kyo Nakajima ◽  
Takahiro Teramoto ◽  
Hiroshi Akagi ◽  
Takashi Fujikawa ◽  
Takuya Majima ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Laser Pulses ◽  
X Ray ◽  
Photoelectron Diffraction

scholarly journals Structure determination of molecules in an alignment laser field by femtosecond photoelectron diffraction using an X-ray free-electron laser

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Shinichirou Minemoto ◽  
Takahiro Teramoto ◽  
Hiroshi Akagi ◽  
Takashi Fujikawa ◽  
Takuya Majima ◽  
...  
Keyword(s):  
Structure Determination ◽  
Free Electron ◽  
Free Electron Laser ◽  
Laser Field ◽  
X Ray ◽  
Photoelectron Diffraction

ANGLE-RESOLVED SOFT X-RAY PHOTOEMISSION FOR THE VALENCE BAND OF GRAPHITE

2002 ◽  
Vol 09 (02) ◽  
pp. 1321-1326 ◽  
Author(s):  
TOMOHIRO MATSUSHITA ◽  
TAKAYUKI MURO ◽  
YUJI SAITOH ◽  
TAKESHI NAKATANI ◽  
AKIRA SEKIYAMA ◽  
...  
Keyword(s):  
Band Structure ◽  
Valence Band ◽  
Crystal Surface ◽  
Pyrolytic Graphite ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Valence Bands ◽  
Diffraction Effects ◽  
Bulk Band ◽  
Better Than

Angle-resolved photoemission in the soft X-ray region has so far been used to study crystal (surface) structure by using photoelectron diffraction phenomena. In this energy region, the observation of the band structure was considered to be difficult, because the momentum of the incident photon cannot be negligible, the emitted electron is strongly influenced by the electron diffraction effects, and the cross section of the valence band is very small. We have performed the angle-resolved photoemission from the valence bands of highly oriented pyrolytic graphite by using the soft X-ray (hν=980 eV ) and successfully observed the band structure. The appearance of the structures of the band density of state is also discussed. Since the escape depth for the electrons with high kinetic energies is longer than ARUPS, this experimental method is better than the usual ARUPS in order to study the bulk band structures in solids.

X-ray photoelectron spectroscopy studies of Ge epilayers on Si(100)

1992 ◽  
Vol 70 (10-11) ◽  
pp. 799-802 ◽  
Author(s):  
Z. H. Lu ◽  
J.-M. Baribeau ◽  
T. E. Jackman
Keyword(s):  
Valence Band ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
Valence Band Maximum ◽  
High Energy Resolution ◽  
Orbit Splitting ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Spin Orbit Splitting ◽  
Spectroscopy Studies

High-energy resolution X-ray photoelectron spectroscopy, with full width at half maximum of 0.41 eV for the Si 2p and of 0.54 eV for the Ge 3d, has been used to study the valence band offsets of different strained Ge layers grown on Si (100). The fractional volume changes in Ge epilayers have been measured by X-ray photoelectron diffraction and are used to correct the valence band maximum shifts caused by strained-induced spin-orbit splitting at the maxima. Band offset values of 0.80, 0.76, and 0.71 eV are found for Si/(Ge5Si5)/Si (100), Si/(Ge4Si4)/Si (100), and Si/(Ge0.5Si0.5)/Si (100) epilayers, respectively.

Initial stages of growth of Mn on Ag(100) studied by X-ray photoelectron diffraction and valence band photoemission

1996 ◽  
Vol 352-354 ◽  
pp. 823-827 ◽  
Author(s):  
P. Schieffer ◽  
C. Krembel ◽  
M.C. Hanf ◽  
D. Bolmont ◽  
G. Gewinner
Keyword(s):  
Valence Band ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Stages Of Growth
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