Localized charges in thin films by Kelvin probe force microscopy: From single to multiple charges

2020 ◽  
Vol 101 (7) ◽  
Author(s):  
A. M. Somoza ◽  
E. Palacios-Lidón
Keyword(s):  
Thin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Thin films of amphiphilic polyelectrolytes. Soft materials characterized by Kelvin probe force microscopy

Polymer ◽  
2013 ◽  
Vol 54 (21) ◽  
pp. 5733-5740 ◽  
Author(s):  
X.G. Briones ◽  
M.D. Urzúa ◽  
H.E. Ríos ◽  
F.J. Espinoza-Beltrán ◽  
R. Dabirian ◽  
...  
Keyword(s):  
Thin Films ◽  
Soft Materials ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Evaluation of Kelvin probe force microscopy for imaging grain boundaries in chalcopyrite thin films

2006 ◽  
Vol 89 (11) ◽  
pp. 113120 ◽  
Author(s):  
C. Leendertz ◽  
F. Streicher ◽  
M. Ch. Lux-Steiner ◽  
S. Sadewasser
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

scholarly journals Nanoscale Characteristics of Ocular Lipid Thin Films Using Kelvin Probe Force Microscopy

2020 ◽  
Vol 9 (7) ◽  
pp. 41
Author(s):  
Elizabeth Drolle ◽  
William Ngo ◽  
Zoya Leonenko ◽  
Lakshman Subbaraman ◽  
Lyndon Jones
Keyword(s):  
Thin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Local charge writing in epitaxial SmNiO3 thin films

2014 ◽  
Vol 2 (19) ◽  
pp. 3805-3811 ◽  
Author(s):  
Feng Yan ◽  
Frank Schoofs ◽  
Jian Shi ◽  
Sieu D. Ha ◽  
R. Jaramillo ◽  
...  
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Insulator Transition ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Metal Insulator Transition ◽  
Metal Insulator ◽  
Force Microscopy ◽  
Local Charge

We have investigated the evolution of work function in epitaxial correlated perovskite SmNiO3 (SNO) thin films spanning the metal–insulator transition (MIT) by Kelvin probe force microscopy (KPFM).

scholarly journals Cover Feature: Investigation of Surface Sulfurization in CuIn1−x Ga x S2−y Se y Thin Films by Using Kelvin Probe Force Microscopy (ChemPhysChem 3/2018)

ChemPhysChem ◽  
2018 ◽  
Vol 19 (3) ◽  
pp. 249-249
Author(s):  
Haeri Kim ◽  
Se Jin Park ◽  
Byungwoo Kim ◽  
Yun Jeong Hwang ◽  
Byoung Koun Min
Keyword(s):  
Thin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy
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