Electronic Properties of Doped Molecular Thin Films Measured by Kelvin Probe Force Microscopy†

2006 ◽  
Vol 110 (50) ◽  
pp. 25521-25524 ◽  
Author(s):  
O. Tal ◽  
Y. Rosenwaks
Keyword(s):  
Thin Films ◽  
Electronic Properties ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Molecular Thin Films

Thin films of amphiphilic polyelectrolytes. Soft materials characterized by Kelvin probe force microscopy

Polymer ◽  
2013 ◽  
Vol 54 (21) ◽  
pp. 5733-5740 ◽  
Author(s):  
X.G. Briones ◽  
M.D. Urzúa ◽  
H.E. Ríos ◽  
F.J. Espinoza-Beltrán ◽  
R. Dabirian ◽  
...  
Keyword(s):  
Thin Films ◽  
Soft Materials ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Evaluation of Kelvin probe force microscopy for imaging grain boundaries in chalcopyrite thin films

2006 ◽  
Vol 89 (11) ◽  
pp. 113120 ◽  
Author(s):  
C. Leendertz ◽  
F. Streicher ◽  
M. Ch. Lux-Steiner ◽  
S. Sadewasser
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

The local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations

Nanoscale ◽  
2017 ◽  
Vol 9 (18) ◽  
pp. 5812-5821 ◽  
Author(s):  
Ayhan Yurtsever ◽  
Delia Fernández-Torre ◽  
Jo Onoda ◽  
Masayuki Abe ◽  
Seizo Morita ◽  
...  
Keyword(s):  
Electronic Properties ◽  
First Principles ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

scholarly journals Nanoscale Characteristics of Ocular Lipid Thin Films Using Kelvin Probe Force Microscopy

2020 ◽  
Vol 9 (7) ◽  
pp. 41
Author(s):  
Elizabeth Drolle ◽  
William Ngo ◽  
Zoya Leonenko ◽  
Lakshman Subbaraman ◽  
Lyndon Jones
Keyword(s):  
Thin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Local charge writing in epitaxial SmNiO3 thin films

2014 ◽  
Vol 2 (19) ◽  
pp. 3805-3811 ◽  
Author(s):  
Feng Yan ◽  
Frank Schoofs ◽  
Jian Shi ◽  
Sieu D. Ha ◽  
R. Jaramillo ◽  
...  
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Insulator Transition ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Metal Insulator Transition ◽  
Metal Insulator ◽  
Force Microscopy ◽  
Local Charge

We have investigated the evolution of work function in epitaxial correlated perovskite SmNiO3 (SNO) thin films spanning the metal–insulator transition (MIT) by Kelvin probe force microscopy (KPFM).

Sign in / Sign up

Export Citation Format

Share Document