Local charge writing in epitaxial SmNiO3 thin films

2014 ◽  
Vol 2 (19) ◽  
pp. 3805-3811 ◽  
Author(s):  
Feng Yan ◽  
Frank Schoofs ◽  
Jian Shi ◽  
Sieu D. Ha ◽  
R. Jaramillo ◽  
...  
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Insulator Transition ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Metal Insulator Transition ◽  
Metal Insulator ◽  
Force Microscopy ◽  
Local Charge

We have investigated the evolution of work function in epitaxial correlated perovskite SmNiO3 (SNO) thin films spanning the metal–insulator transition (MIT) by Kelvin probe force microscopy (KPFM).

Evolution of local work function in epitaxial VO2 thin films spanning the metal-insulator transition

2012 ◽  
Vol 101 (19) ◽  
pp. 191605 ◽  
Author(s):  
Ahrum Sohn ◽  
Haeri Kim ◽  
Dong-Wook Kim ◽  
Changhyun Ko ◽  
Shriram Ramanathan ◽  
...  
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Insulator Transition ◽  
Metal Insulator Transition ◽  
Metal Insulator ◽  
Vo2 Thin Films ◽  
Local Work

scholarly journals Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

2016 ◽  
Vol 108 (4) ◽  
pp. 041602 ◽  
Author(s):  
B. Eren ◽  
U. Gysin ◽  
L. Marot ◽  
Th. Glatzel ◽  
R. Steiner ◽  
...  
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Layer Graphene ◽  
Few Layer Graphene

Thin films of amphiphilic polyelectrolytes. Soft materials characterized by Kelvin probe force microscopy

Polymer ◽  
2013 ◽  
Vol 54 (21) ◽  
pp. 5733-5740 ◽  
Author(s):  
X.G. Briones ◽  
M.D. Urzúa ◽  
H.E. Ríos ◽  
F.J. Espinoza-Beltrán ◽  
R. Dabirian ◽  
...  
Keyword(s):  
Thin Films ◽  
Soft Materials ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

scholarly journals Work function difference of naphthyl end-capped oligothiophene in different crystal alignments studied by Kelvin probe force microscopy

2020 ◽  
pp. 106060
Author(s):  
Mads Nibe Larsen ◽  
Mads Svanborg Peters ◽  
Rodrigo Lemos-Silva ◽  
Demetrio A. Da Silva Filho ◽  
Bjarke Jørgensen ◽  
...  
Keyword(s):  
Work Function ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Work Function Difference ◽  
Function Difference
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