scholarly journals Cover Feature: Investigation of Surface Sulfurization in CuIn1−x Ga x S2−y Se y Thin Films by Using Kelvin Probe Force Microscopy (ChemPhysChem 3/2018)

ChemPhysChem ◽  
2018 ◽  
Vol 19 (3) ◽  
pp. 249-249
Author(s):  
Haeri Kim ◽  
Se Jin Park ◽  
Byungwoo Kim ◽  
Yun Jeong Hwang ◽  
Byoung Koun Min
Keyword(s):  
Thin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Thin films of amphiphilic polyelectrolytes. Soft materials characterized by Kelvin probe force microscopy

Polymer ◽  
2013 ◽  
Vol 54 (21) ◽  
pp. 5733-5740 ◽  
Author(s):  
X.G. Briones ◽  
M.D. Urzúa ◽  
H.E. Ríos ◽  
F.J. Espinoza-Beltrán ◽  
R. Dabirian ◽  
...  
Keyword(s):  
Thin Films ◽  
Soft Materials ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Evaluation of Kelvin probe force microscopy for imaging grain boundaries in chalcopyrite thin films

2006 ◽  
Vol 89 (11) ◽  
pp. 113120 ◽  
Author(s):  
C. Leendertz ◽  
F. Streicher ◽  
M. Ch. Lux-Steiner ◽  
S. Sadewasser
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

scholarly journals Nanoscale Characteristics of Ocular Lipid Thin Films Using Kelvin Probe Force Microscopy

2020 ◽  
Vol 9 (7) ◽  
pp. 41
Author(s):  
Elizabeth Drolle ◽  
William Ngo ◽  
Zoya Leonenko ◽  
Lakshman Subbaraman ◽  
Lyndon Jones
Keyword(s):  
Thin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Local charge writing in epitaxial SmNiO3 thin films

2014 ◽  
Vol 2 (19) ◽  
pp. 3805-3811 ◽  
Author(s):  
Feng Yan ◽  
Frank Schoofs ◽  
Jian Shi ◽  
Sieu D. Ha ◽  
R. Jaramillo ◽  
...  
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Insulator Transition ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Metal Insulator Transition ◽  
Metal Insulator ◽  
Force Microscopy ◽  
Local Charge

We have investigated the evolution of work function in epitaxial correlated perovskite SmNiO3 (SNO) thin films spanning the metal–insulator transition (MIT) by Kelvin probe force microscopy (KPFM).

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