scholarly journals A method for characterizing near-interface traps in SiC metal–oxide–semiconductor capacitors from conductance–temperature spectroscopy measurements

2021 ◽  
Vol 129 (5) ◽  
pp. 054501
Author(s):  
Jordan R. Nicholls ◽  
Arnar M. Vidarsson ◽  
Daniel Haasmann ◽  
Einar Ö. Sveinbjörnsson ◽  
Sima Dimitrijev
Keyword(s):  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Interface Traps

scholarly journals Degradation of inversion layer electron mobility due to interface traps in metal‐oxide‐semiconductor transistors

1995 ◽  
Vol 78 (5) ◽  
pp. 3252-3257 ◽  
Author(s):  
Toshimasa Matsuoka ◽  
Shigenari Taguchi ◽  
Quazi Deen Mohd Khosru ◽  
Kenji Taniguchi ◽  
Chihiro Hamaguchi
Keyword(s):  
Metal Oxide ◽  
Electron Mobility ◽  
Inversion Layer ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Interface Traps

Investigation of Near-Interface Traps Generated by NO Direct Oxidation in C-face 4H-SiC Metal–Oxide–Semiconductor Structures

2009 ◽  
Vol 2 ◽  
pp. 021201 ◽  
Author(s):  
Dai Okamoto ◽  
Hiroshi Yano ◽  
Yuki Oshiro ◽  
Tomoaki Hatayama ◽  
Yukiharu Uraoka ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Interface Traps ◽  
Direct Oxidation ◽  
Semiconductor Structures

Characterization of near-interface traps at 4H-SiC metal–oxide–semiconductor interfaces using modified distributed circuit model

2017 ◽  
Vol 10 (6) ◽  
pp. 064101 ◽  
Author(s):  
Xufang Zhang ◽  
Dai Okamoto ◽  
Tetsuo Hatakeyama ◽  
Mitsuru Sometani ◽  
Shinsuke Harada ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Circuit Model ◽  
Oxide Semiconductor ◽  
Interface Traps ◽  
Semiconductor Interfaces

Effects of oxide traps, interface traps, and ‘‘border traps’’ on metal‐oxide‐semiconductor devices

1993 ◽  
Vol 73 (10) ◽  
pp. 5058-5074 ◽  
Author(s):  
D. M. Fleetwood ◽  
P. S. Winokur ◽  
R. A. Reber ◽  
T. L. Meisenheimer ◽  
J. R. Schwank ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Semiconductor Devices ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Interface Traps ◽  
Oxide Traps
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