High‐speed operation of InP metal‐insulator‐semiconductor field‐effect transistors grown by chloride vapor phase epitaxy

1987 ◽  
Vol 51 (14) ◽  
pp. 1097-1099 ◽  
Author(s):  
A. Antreasyan ◽  
P. A. Garbinski ◽  
V. D. Mattera ◽  
H. Temkin ◽  
J. H. Abeles
1987 ◽  
Vol 34 (9) ◽  
pp. 1897-1901 ◽  
Author(s):  
A. Antreasyan ◽  
P.A. Garbinski ◽  
V.D. Mattera ◽  
J.M. Wiesenfeld ◽  
R.S. Tucker ◽  
...  

1989 ◽  
Vol 54 (2) ◽  
pp. 176-178
Author(s):  
A. Antreasyan ◽  
P. A. Garbinski ◽  
V. D. Mattera ◽  
M. D. Feuer ◽  
J. Filipe ◽  
...  

2010 ◽  
Vol 97 (25) ◽  
pp. 253502 ◽  
Author(s):  
Yuji Urabe ◽  
Masafumi Yokoyama ◽  
Hideki Takagi ◽  
Tetsuji Yasuda ◽  
Noriyuki Miyata ◽  
...  

2019 ◽  
Vol 7 (29) ◽  
pp. 8855-8860 ◽  
Author(s):  
Janghyuk Kim ◽  
Marko J. Tadjer ◽  
Michael A. Mastro ◽  
Jihyun Kim

The threshold voltage of β-Ga2O3 metal–insulator–semiconductor field-effect transistors is controlled via remote fluorine plasma treatment, enabling an enhancement-mode operation under double gate condition.


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