New approach to the kinetics of silicon vapor phase epitaxy at reduced temperature

1987 ◽  
Vol 50 (22) ◽  
pp. 1575-1577 ◽  
Author(s):  
D. J. Robbins ◽  
I. M. Young
1997 ◽  
Vol 482 ◽  
Author(s):  
A. Usui

AbstractA new approach to grow thick GaN layers by hydride vapor phase epitaxy (HVPE) is described. Selective growth is carried out at the beginning of growth. The coalescence of selectively grown facet structures makes it possible to achieve a flat surface over the entire substrate. As a result, crack-free GaN films with mirror-like surfaces are successfully grown even to a thickness of about 100 μm on a 2-inch-diameter sapphire substrate. The extended defect density is as low as 6×107 cm−2. The reduction mechanism for dislocation is discussed based on TEM observation. The high optical properties of FIELO GaN are confirmed by 5 K photoluminescence and reflectance measurements.


2000 ◽  
Vol 209 (4) ◽  
pp. 716-723 ◽  
Author(s):  
H. Fukuto ◽  
P. Feichtinger ◽  
G.D. U'Ren ◽  
S. Lindo ◽  
M.S. Goorsky ◽  
...  

2004 ◽  
Vol 45 (7) ◽  
pp. 2395-2402 ◽  
Author(s):  
Ramanujam Rajagopal ◽  
Yalamanchili Krishna Rao

1998 ◽  
Vol 37 (Part 1, No. 9A) ◽  
pp. 4914-4918 ◽  
Author(s):  
Bonheun Koo ◽  
Jifeng Wang ◽  
Yukio Ishikawa ◽  
Chan-Gyu Lee ◽  
Minoru Isshiki

2019 ◽  
Vol 25 (8) ◽  
pp. 507-512 ◽  
Author(s):  
Masakazu Sugiyama ◽  
Satoshi Yasukochi ◽  
Tomonari Shioda ◽  
Yukihiro Shimogaki ◽  
Yoshiaki Nakano

CrystEngComm ◽  
2018 ◽  
Vol 20 (45) ◽  
pp. 7364-7370 ◽  
Author(s):  
Xu-Qiang Shen ◽  
Kazutoshi Kojima ◽  
Mitsuaki Shimizu ◽  
Hajime Okumura

We propose a new growth technique, ammonia-free high temperature metalorganic vapor phase epitaxy (AFHT-MOVPE), for high quality AlN growth.


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