Pulsed excimer laser annealing of ion implanted silicon: Characterization and solar cell fabrication

1982 ◽  
Vol 41 (10) ◽  
pp. 938-940 ◽  
Author(s):  
D. H. Lowndes ◽  
J. W. Cleland ◽  
W. H. Christie ◽  
R. E. Eby ◽  
G. E. Jellison ◽  
...  
1982 ◽  
Vol 3 (10) ◽  
pp. 280-283 ◽  
Author(s):  
R.T. Young ◽  
G.A. van der Leeden ◽  
J. Narayan ◽  
W.H. Christie ◽  
R.F. Wood ◽  
...  

2003 ◽  
Vol 208-209 ◽  
pp. 292-297 ◽  
Author(s):  
C. Dutto ◽  
E. Fogarassy ◽  
D. Mathiot ◽  
D. Muller ◽  
P. Kern ◽  
...  

2000 ◽  
Vol 39 (Part 1, No. 9A) ◽  
pp. 5063-5068 ◽  
Author(s):  
Jin-Wook Seo ◽  
Satoru Akiyama ◽  
Yoichiro Aya ◽  
Tomoyuki Nohda ◽  
Hiroki Hamada ◽  
...  

1983 ◽  
Vol 23 ◽  
Author(s):  
R. T. Young

ABSTRACTThe present level of development of excimer lasers, as it relates to semiconductor processing, and the advantages of these lasers for such processing, are reviewed. Extensive comparisons of the quality of annealing of ion-implanted Si obtained with XeCl and ruby lasers are presented. Major applications in the area of solar cell fabrication, siliconon-sapphire technology, laser photochemical processing, and submicron optical lithography are outlined and discussed.


1984 ◽  
Vol 55 (4) ◽  
pp. 1125-1130 ◽  
Author(s):  
J. Narayan ◽  
O. W. Holland ◽  
C. W. White ◽  
R. T. Young

2002 ◽  
Vol 74 (1-4) ◽  
pp. 289-294 ◽  
Author(s):  
H. Azuma ◽  
A. Takeuchi ◽  
T. Ito ◽  
H. Fukushima ◽  
T. Motohiro ◽  
...  

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