scholarly journals Charge trapping analysis in sputtered BixSe1-x based accumulation-mode FETs

AIP Advances ◽  
2020 ◽  
Vol 10 (1) ◽  
pp. 015315 ◽  
Author(s):  
Protyush Sahu ◽  
Jun-Yang Chen ◽  
Jian-Ping Wang
1996 ◽  
Vol 444 ◽  
Author(s):  
Hyeon-Seag Kim ◽  
D. L. Polla ◽  
S. A. Campbell

AbstractThe electrical reliability properties of PZT (54/46) thin films have been measured for the purpose of integrating this material with silicon-based microelectromechanical systems. Ferroelectric thin films of PZT were prepared by metal organic decomposition. The charge trapping and degradation properties of these thin films were studied through device characteristics such as hysteresis loop, leakage current, fatigue, dielectric constant, capacitancevoltage, and loss factor measurements. Several unique experimental results have been found. Different degradation processes were verified through fatigue (bipolar stress), low and high charge injection (unipolar stress), and high field stressing (unipolar stress).


2021 ◽  
Vol 60 (1) ◽  
pp. 011003
Author(s):  
Jeong Yong Yang ◽  
Chan Ho Lee ◽  
Young Taek Oh ◽  
Jiyeon Ma ◽  
Junseok Heo ◽  
...  

2014 ◽  
Vol 26 (45) ◽  
pp. 7555-7560 ◽  
Author(s):  
Shota Nunomura ◽  
Xiaozhou Che ◽  
Stephen R. Forrest

Author(s):  
Shan Deng ◽  
Zhouhang Jiang ◽  
Sourav Dutta ◽  
Huacheng Ye ◽  
Wriddhi Chakraborty ◽  
...  

Author(s):  
Jie Lv ◽  
Hua Tang ◽  
Jiaming Huang ◽  
Cenqi Yan ◽  
Kuan Liu ◽  
...  

Due to the barrierless free charge generation, low charge trapping, and high charge mobilities, the PM6:Y6 organic solar cell (OSC) achieves excellent power conversion efficiency (PCE) of 15.7%. However, the...


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