2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 77)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781665419345

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Analysis of Drain Current Enhancement in "PN-Body Tied SOI-FET" -Bulk vs Surface Conduction Mode and Low Vds Saturation Effect-

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440108 ◽

2021 ◽

Author(s):

Hiroki Itoh ◽

Jiro Ida ◽

Takayuki Mori ◽

Koichiro Ishibashi

Keyword(s):

Drain Current ◽

Saturation Effect ◽

Surface Conduction ◽

Conduction Mode

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Alleviation of Charge Trapping and Flicker Noise in HfZrO2-Based Ferroelectric Capacitors by Thermal Engineering

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440091 ◽

2021 ◽

Author(s):

Sourav De ◽

Wei-Xuan Bu ◽

Bo-Han Qiu ◽

Chung-Jun Su ◽

Yao-Jen Lee ◽

...

Keyword(s):

Flicker Noise ◽

Charge Trapping ◽

Thermal Engineering ◽

Ferroelectric Capacitors

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On-Wafer Electronic Layer Detectors Array (ELDA) for e-beam Imaging in Advanced Lithographic Systems

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440046 ◽

2021 ◽

Author(s):

Chien-Ping Wang ◽

Bum Jeng Lin ◽

Jiaw-Ren Shih ◽

Yue-Der Chih ◽

Jonathan Chang ◽

...

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FinFET Plus: A Scalable FinFET Architecture with 3D Air-Gap and Air-Spacer Toward the 3nm Generation and Beyond

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440097 ◽

2021 ◽

Author(s):

C. K. Chiang ◽

H. Pai ◽

J. L. Lin ◽

J. K. Chang ◽

M. Y. Lee ◽

...

Keyword(s):

Air Gap

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Active Silicon Chiplet-Based Interposer for Exascale High Performance Computing

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440082 ◽

2021 ◽

Author(s):

Severine Cheramy ◽

Pascal Vivet ◽

Denis Dutoit ◽

Fabien Clermidy ◽

Jean Charbonnier ◽

...

Keyword(s):

High Performance Computing ◽

High Performance ◽

Performance Computing

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Hardware Security - Back to the Future

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440100 ◽

2021 ◽

Keyword(s):

Hardware Security ◽

The Future

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The Pursuit of Atomistic Switching and Cross Point Memory

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440112 ◽

2021 ◽

Author(s):

Der Chang Kau

Keyword(s):

Cross Point

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Autopilot, Smart IoT Devices for Accelerating the Development of Bio-electronic Medicine

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440105 ◽

2021 ◽

Author(s):

Hsin Chen

Keyword(s):

Iot Devices

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A Novel Design of Ferroelectric Nanowire Tunnel Field Effect Transistors

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440098 ◽

2021 ◽

Author(s):

Narasimhulu Thoti ◽

Yiming Li

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Novel Design

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A precise debugging method and defect diagnosis with mass big-data analysis in the designed high-dense array for rapid yield improvement in a logic platform

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ◽

10.1109/vlsi-tsa51926.2021.9440044 ◽

2021 ◽

Author(s):

Chan-Ching Lin ◽

Shenzhi-Yang Lin ◽

Ryan Liang ◽

Chi-Pei Lu ◽

Cheng-Shu Ho ◽

...

Keyword(s):

Big Data ◽

Data Analysis ◽

Big Data Analysis ◽

Dense Array ◽

Yield Improvement ◽

Defect Diagnosis

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2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Analysis of Drain Current Enhancement in "PN-Body Tied SOI-FET" -Bulk vs Surface Conduction Mode and Low Vds Saturation Effect-

Alleviation of Charge Trapping and Flicker Noise in HfZrO2-Based Ferroelectric Capacitors by Thermal Engineering

On-Wafer Electronic Layer Detectors Array (ELDA) for e-beam Imaging in Advanced Lithographic Systems

FinFET Plus: A Scalable FinFET Architecture with 3D Air-Gap and Air-Spacer Toward the 3nm Generation and Beyond

Active Silicon Chiplet-Based Interposer for Exascale High Performance Computing

Hardware Security - Back to the Future

The Pursuit of Atomistic Switching and Cross Point Memory

Autopilot, Smart IoT Devices for Accelerating the Development of Bio-electronic Medicine

A Novel Design of Ferroelectric Nanowire Tunnel Field Effect Transistors

A precise debugging method and defect diagnosis with mass big-data analysis in the designed high-dense array for rapid yield improvement in a logic platform

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
Latest Publications