Time-resolved photoluminescence from n-doped GaN/Al0.18Ga0.82N short-period superlattices probes carrier kinetics and long-term structural stability

2019 ◽  
Vol 125 (18) ◽  
pp. 185705 ◽  
Author(s):  
Felix Mahler ◽  
Jens W. Tomm ◽  
Klaus Reimann ◽  
Michael Woerner ◽  
Veit Hoffmann ◽  
...  
1993 ◽  
Vol 74 (8) ◽  
pp. 5272-5274 ◽  
Author(s):  
R. Hellmann ◽  
A. Pohlmann ◽  
E. O. Göbel ◽  
D. R. Yakovlev ◽  
A. Waag ◽  
...  

1999 ◽  
Vol 38 (Part 2, No. 9A/B) ◽  
pp. L1006-L1008 ◽  
Author(s):  
Mayuko Fudeta ◽  
Hajime Asahi ◽  
Kumiko Asami ◽  
Yukio Narukawa ◽  
Yoichi Kawakami ◽  
...  

1998 ◽  
Author(s):  
Vladimir G. Litovchenko ◽  
Dmytro V. Korbutyak ◽  
Sergiy G. Krylyuk ◽  
Holger T. Grahn ◽  
R. Klann ◽  
...  

2003 ◽  
Vol 770 ◽  
Author(s):  
Gong-Ru Lin ◽  
Chun-Jung Lin

AbstractThe effects of annealing time on continuous-wave (CW) and nanosecond time-resolved (TR) photoluminescence (PL) spectra of silicon-ion-implanted Borosilicate glass (BSO:Si+) annealing at 500°C are characterized. A broadband CWPL of the as-implanted BSO:Si+ at 450-530 nm is observed, and the luminescent peak is found to slightly red-shift after annealing for 90 min. The increasing CWPL intensity reveals that the natural oxygen vacancy (NOV, ΞSi Si-SiΞ) related irradiative defect is highly activated during 30-min annealing, however, which abruptly decreases with the annealing lengthens to 60-min or longer. The TRPL analysis indicates a non-radiative recombination process with a sub-picosecond lifetime for the blank BSO and the as-implanted BSO:Si+ samples, which gradually disappears as the BSO:Si+ is long-term annealed. The irradiative luminescent lifetime of the 60-min annealed BSO:Si+ is lengthened from 1.7 ns to 2.8 ns, which reveals that the density of the NOV defect is decreasing by at least one order of magnitude. A longer irradiative decay with nearly identical lifetime is also found in all annealed BSO:Si+. The ratios of TRPL peak intensities for different samples correlate well with those observed in CWPL measurement, however, the weighting factors of TRPL intensities for the latter two decaying components are vicissitudinous each other in different samples BSO:Si+. This interprets a significant evolution among different decaying mechanisms during the annealing process.


Author(s):  
T. Kizuka ◽  
N. Tanaka

Structure and stability of atomic clusters have been studied by time-resolved high-resolution electron microscopy (TRHREM). Typical examples are observations of structural fluctuation in gold (Au) clusters supported on silicon oxide films, graphtized carbon films and magnesium oxide (MgO) films. All the observations have been performed on the clusters consisted of single metal element. Structural stability of ceramics clusters, such as metal-oxide, metal-nitride and metal-carbide clusters, has not been observed by TRHREM although the clusters show anomalous structural and functional properties concerning to solid state physics and materials science.In the present study, the behavior of ceramic, magnesium oxide (MgO) clusters is for the first time observed by TRHREM at 1/60 s time resolution and at atomic resolution down to 0.2 nm.MgO and gold were subsequently deposited on sodium chloride (001) substrates. The specimens, single crystalline MgO films on which Au particles were dispersed were separated in distilled water and observed by using a 200-kV high-resolution electron microscope (JEOL, JEM2010) equipped with a high sensitive TV camera and a video tape recorder system.


1991 ◽  
Vol 1 (4) ◽  
pp. 503-510 ◽  
Author(s):  
P. Jeanjean ◽  
J. Sicart ◽  
J. L. Robert ◽  
F. Mollot ◽  
R. Planel

1999 ◽  
Vol 169 (4) ◽  
pp. 468 ◽  
Author(s):  
S.V. Ivanov ◽  
Petr S. Kop'ev ◽  
A.A. Toropov

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