Temperature dependence of the dielectric function of thin film CuI in the spectral range (0.6–8.3) eV

2018 ◽  
Vol 113 (17) ◽  
pp. 172102 ◽  
Author(s):  
Evgeny Krüger ◽  
Vitaly Zviagin ◽  
Chang Yang ◽  
Chris Sturm ◽  
Rüdiger Schmidt-Grund ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Dependence ◽  
Dielectric Function ◽  
Spectral Range

scholarly journals Temperature dependence of the dielectric function in the spectral range (0.5–8.5) eV of an In2O3 thin film

2014 ◽  
Vol 105 (11) ◽  
pp. 111906 ◽  
Author(s):  
R. Schmidt-Grund ◽  
H. Krauß ◽  
C. Kranert ◽  
M. Bonholzer ◽  
M. Grundmann
Keyword(s):  
Thin Film ◽  
Temperature Dependence ◽  
Dielectric Function ◽  
Spectral Range

scholarly journals Dielectric function in the spectral range (0.5–8.5)eV of an (Alx Ga1−x)2O3 thin film with continuous composition spread

2015 ◽  
Vol 117 (16) ◽  
pp. 165307 ◽  
Author(s):  
R. Schmidt-Grund ◽  
C. Kranert ◽  
H. von Wenckstern ◽  
V. Zviagin ◽  
M. Lorenz ◽  
...  
Keyword(s):  
Thin Film ◽  
Dielectric Function ◽  
Spectral Range

From Semiconductor to Metal in a Flash: Observing Ultrafast Laser-Induced Phase Transformations

1997 ◽  
Vol 481 ◽  
Author(s):  
J. P. Callan ◽  
A. M.-T. Kim ◽  
L. Huangt ◽  
E. N. Glezer ◽  
E. Mazur
Keyword(s):  
Phase Transformations ◽  
Dielectric Function ◽  
Spectral Range ◽  
Laser Excitation ◽  
Spectroscopic Technique ◽  
Ultrafast Laser ◽  
Lattice Heating ◽  
Fs Laser

ABSTRACTWe use a new broadband spectroscopic technique to measure ultrafast changes in the dielectric function of a material over the spectral range 1.5–3.5 eV following intense 70-fs laser excitation. The results reveal the nature of the phase transformations which occur in the material following excitation. We studied the response of GaAs and Si. For GaAs, there are three distinct regimes of behavior as the pump fluence is increased — lattice heating, lattice disordering, and a semiconductor-to-metal transition.

Analytical model and temperature dependence of the thin film SOI FET

1995 ◽  
Vol 38 (5) ◽  
pp. 949-959 ◽  
Author(s):  
S Scheinert ◽  
G Paasch ◽  
D Schipanski
Keyword(s):  
Thin Film ◽  
Temperature Dependence ◽  
Analytical Model

Temperature dependence of coercivity in Co-based longitudinal thin-film recording media

1997 ◽  
Vol 81 (8) ◽  
pp. 3952-3954 ◽  
Author(s):  
Tao Pan ◽  
Geoffrey W. D. Spratt ◽  
Li Tang ◽  
Li-Lien Lee ◽  
Yongchang Feng ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Dependence ◽  
Recording Media
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