Negative differential resistance in nickel octabutoxy phthalocyanine and nickel octabutoxy phthalocyanine/graphene oxide ultrathin films

2018 ◽  
Vol 123 (15) ◽  
pp. 155501 ◽  
Author(s):  
Arup Sarkar ◽  
K. A. Suresh
2018 ◽  
Vol 8 (1) ◽  
Author(s):  
Servin Rathi ◽  
Inyeal Lee ◽  
Moonshik Kang ◽  
Dongsuk Lim ◽  
Yoontae Lee ◽  
...  

2021 ◽  
Vol 67 ◽  
pp. 25-31
Author(s):  
Sophia R. Figarova ◽  
Elvin M. Aliyev ◽  
Rashad G. Abaszade ◽  
R.I. Alekberov ◽  
Vagif R. Figarov

Graphene oxide/sulphur compound was synthesized by Hammers method. The chemical composition, presence/quantity of functional groups, exfoliation level, number of layers, crystallite size of graphene oxide/sulphur were characterized by X-ray diffraction, Raman spectroscopy, and scanning electron microscopy images. The current-voltage characteristics of the samples were measured in air at room temperature. In the I - V characteristic curve of graphene oxide/sulphur compound with the ratio of oxygen to carbon of 3.54 and that to sulphur of 42.54, negative differential resistance was observed. The negative differential resistance is attributed to current carrier transitions between the localized states formed by functional groups.


2013 ◽  
Vol 113 (3) ◽  
pp. 034308 ◽  
Author(s):  
R. Batabyal ◽  
A. H. M. Abdul Wasey ◽  
J. C. Mahato ◽  
Debolina Das ◽  
A. Roy ◽  
...  

Author(s):  
Sonia Sharma ◽  
Chieh-An Cheng ◽  
Svette Reina Merden Santiago ◽  
Denice N. Feria ◽  
Chi-Tsu Yuan ◽  
...  

Negative differential resistance (NDR) devices have attracted considerable interest due to their potential applications in switches, memory devices, and analog-to-digital converters.


2020 ◽  
Author(s):  
SMITA GAJANAN NAIK ◽  
Mohammad Hussain Kasim Rabinal

Electrical memory switching effect has received a great interest to develop emerging memory technology such as memristors. The high density, fast response, multi-bit storage and low power consumption are their...


2002 ◽  
Vol 25 (3) ◽  
pp. 233-237
Author(s):  
K. F. Yarn

First observation of switching behavior is reported in GaAs metal-insulator-p-n+structure, where the thin insulator is grown at low temperature by a liquid phase chemical-enhanced oxide (LPECO) with a thickness of 100 Å. A significant S-shaped negative differential resistance (NDR) is shown to occur that originates from the regenerative feedback in a tunnel metal/insulator/semiconductor (MIS) interface andp-n+junction. The influence of epitaxial doping concentration on the switching and holding voltages is investigated. The switching voltages are found to be decreased when increasing the epitaxial doping concentration, while the holding voltages are almost kept constant. A high turn-off/turn-on resistance ratio up to105has been obtained.


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