Three-dimensional steady and transient fully coupled electro-thermal simulation of AlGaN/GaN high electron mobility transistors: Effects of lateral heat dissipation and thermal crosstalk between gate fingers
2020 ◽
Vol 19
(3)
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pp. 1107-1115
2014 ◽
Vol 32
(6)
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pp. 061202
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2011 ◽
Vol 29
(4)
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pp. 041202
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