Native-oxide limited cross-plane thermal transport in suspended silicon membranes revealed by scanning thermal microscopy

2017 ◽  
Vol 111 (6) ◽  
pp. 063106 ◽  
Author(s):  
A. M. Massoud ◽  
J.-M. Bluet ◽  
V. Lacatena ◽  
M. Haras ◽  
J.-F. Robillard ◽  
...  
Keyword(s):  
Thermal Transport ◽  
Native Oxide ◽  
Scanning Thermal Microscopy ◽  
Thermal Microscopy ◽  
Silicon Membranes

scholarly journals Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopy

2017 ◽  
Vol 28 (48) ◽  
pp. 485706 ◽  
Author(s):  
Yunfei Ge ◽  
Yuan Zhang ◽  
Jonathan M R Weaver ◽  
Phillip S Dobson
Keyword(s):  
Thin Films ◽  
Thermal Transport ◽  
Scanning Thermal Microscopy ◽  
Thermal Microscopy

scholarly journals Quantifying thermal transport in buried semiconductor nanostructures via Cross-Sectional Scanning Thermal Microscopy

Nanoscale ◽  
2021 ◽  
Author(s):  
Jean Spièce ◽  
Charalambos Evangeli ◽  
Alexander J. Robson ◽  
Alexandros El Sachat ◽  
Linda Haenel ◽  
...  
Keyword(s):  
Thermal Transport ◽  
Semiconductor Nanostructures ◽  
Scanning Thermal Microscopy ◽  
Thermoelectric Devices ◽  
Cross Sectional ◽  
Moore’S Law ◽  
Thermal Microscopy ◽  
Moore's Law ◽  
Speed Increase ◽  
Clock Speed

Managing thermal transport in nanostructures became a major challenge in development of active microelectronic, optoelectronic and thermoelectric devices, stalling the famous Moore’s law of clock speed increase of microprocessors for...

scholarly journals Scanning Thermal Microscopy of Ultrathin Films: Numerical Studies Regarding Cantilever Displacement, Thermal Contact Areas, Heat Fluxes, and Heat Distribution

Nanomaterials ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 491
Author(s):  
Christoph Metzke ◽  
Fabian Kühnel ◽  
Jonas Weber ◽  
Günther Benstetter
Keyword(s):  
Thermal Properties ◽  
Ultrathin Films ◽  
Hexagonal Boron Nitride ◽  
Thermal Contact ◽  
Heat Transfer Process ◽  
Heat Propagation ◽  
Heat Fluxes ◽  
Detailed Knowledge ◽  
Scanning Thermal Microscopy ◽  
Thermal Microscopy

New micro- and nanoscale devices require electrically isolating materials with specific thermal properties. One option to characterize these thermal properties is the atomic force microscopy (AFM)-based scanning thermal microscopy (SThM) technique. It enables qualitative mapping of local thermal conductivities of ultrathin films. To fully understand and correctly interpret the results of practical SThM measurements, it is essential to have detailed knowledge about the heat transfer process between the probe and the sample. However, little can be found in the literature so far. Therefore, this work focuses on theoretical SThM studies of ultrathin films with anisotropic thermal properties such as hexagonal boron nitride (h-BN) and compares the results with a bulk silicon (Si) sample. Energy fluxes from the probe to the sample between 0.6 µW and 126.8 µW are found for different cases with a tip radius of approximately 300 nm. A present thermal interface resistance (TIR) between bulk Si and ultrathin h-BN on top can fully suppress a further heat penetration. The time until heat propagation within the sample is stationary is found to be below 1 µs, which may justify higher tip velocities in practical SThM investigations of up to 20 µms−1. It is also demonstrated that there is almost no influence of convection and radiation, whereas a possible TIR between probe and sample must be considered.

scholarly journals Thermal transport in nanoporous holey silicon membranes investigated with optically induced transient thermal gratings

2020 ◽  
Vol 128 (23) ◽  
pp. 235106
Author(s):  
Ryan A. Duncan ◽  
Giuseppe Romano ◽  
Marianna Sledzinska ◽  
Alexei A. Maznev ◽  
Jean-Philippe M. Péraud ◽  
...  
Keyword(s):  
Thermal Transport ◽  
Silicon Membranes ◽  
Transient Thermal ◽  
Optically Induced

Adhesive penetration of wood cell walls investigated by scanning thermal microscopy (SThM)

Holzforschung ◽  
2008 ◽  
Vol 62 (1) ◽  
pp. 91-98 ◽  
Author(s):  
Johannes Konnerth ◽  
David Harper ◽  
Seung-Hwan Lee ◽  
Timothy G. Rials ◽  
Wolfgang Gindl
Keyword(s):  
Thermal Conductivity ◽  
Thermal Properties ◽  
Surface Temperature ◽  
Cell Walls ◽  
Adhesive Contact ◽  
Wood Adhesive ◽  
Bond Line ◽  
Scanning Thermal Microscopy ◽  
Thermal Probe ◽  
Thermal Microscopy

Abstract Cross sections of wood adhesive bonds were studied by scanning thermal microscopy (SThM) with the aim of scrutinizing the distribution of adhesive in the bond line region. The distribution of thermal conductivity, as well as temperature in the bond line area, was measured on the surface by means of a nanofabricated thermal probe offering high spatial and thermal resolution. Both the thermal conductivity and the surface temperature measurements were found suitable to differentiate between materials in the bond region, i.e., adhesive, cell walls and embedding epoxy. Of the two SThM modes available, the surface temperature mode provided images with superior optical contrast. The results clearly demonstrate that the polyurethane adhesive did not cause changes of thermal properties in wood cell walls with adhesive contact. By contrast, cell walls adjacent to a phenol-resorcinol-formaldehyde adhesive showed distinctly changed thermal properties, which is attributed to the presence of adhesive in the wood cell wall.

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