All-optical beam deflection method for simultaneous thermal conductivity and thermo-optic coefficient ( dn/dT) measurements

2016 ◽  
Vol 119 (17) ◽  
pp. 173102 ◽  
Author(s):  
Shawn A. Putnam ◽  
Steven B. Fairchild ◽  
Armando A. Arends ◽  
Augustine M. Urbas
Keyword(s):  
Thermal Conductivity ◽  
Optical Beam ◽  
Beam Deflection ◽  
All Optical

All-optical beam deflection induced by cross-phase modulation in bacteriorhodopsin

2000 ◽  
Vol 36 (1) ◽  
pp. 71 ◽  
Author(s):  
R.E. de Araujo ◽  
G. Borissevitch ◽  
A.S.L. Gomes
Keyword(s):  
Phase Modulation ◽  
Optical Beam ◽  
Beam Deflection ◽  
Cross Phase Modulation ◽  
All Optical

All-optical beam deflection and switching in strontium–barium–niobate waveguides

1998 ◽  
Vol 72 (16) ◽  
pp. 1960-1962 ◽  
Author(s):  
D. Kip ◽  
M. Wesner ◽  
E. Krätzig ◽  
V. Shandarov ◽  
P. Moretti
Keyword(s):  
Optical Beam ◽  
Beam Deflection ◽  
Strontium Barium Niobate ◽  
Strontium Barium ◽  
All Optical

Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams

2013 ◽  
Vol 84 (8) ◽  
pp. 083701 ◽  
Author(s):  
Eika Tsunemi ◽  
Kei Kobayashi ◽  
Noriaki Oyabu ◽  
Masaharu Hirose ◽  
Yoshiko Takenaka ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Laser Beams ◽  
Beam Deflection ◽  
Incident Laser ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dual Probe

Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method

2007 ◽  
Vol 46 (8B) ◽  
pp. 5636-5638 ◽  
Author(s):  
Eika Tsunemi ◽  
Nobuo Satoh ◽  
Yuji Miyato ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Atomic Force

A two-axis in-plane motion measurement system based on optical beam deflection

2013 ◽  
Vol 84 (10) ◽  
pp. 105001 ◽  
Author(s):  
R. Sriramshankar ◽  
R. Sri Muthu Mrinalini ◽  
G. R. Jayanth
Keyword(s):  
Measurement System ◽  
Plane Motion ◽  
Optical Beam ◽  
Beam Deflection ◽  
Motion Measurement

Research of a New All-Optical Solid-State Scanner Based on GaAs

2013 ◽  
Vol 710 ◽  
pp. 269-272
Author(s):  
Guo Ya Xu ◽  
Jun Hua He ◽  
Fan Sen ◽  
Yuan Tao Zhu
Keyword(s):  
Solid State ◽  
Optical Waveguide ◽  
High Speed ◽  
Refractive Index Change ◽  
Core Layer ◽  
Beam Deflection ◽  
Optical Scanning ◽  
Signal Light ◽  
Change Effect ◽  
All Optical

Design an all-optical solid-state scanner chip, which can realize high speed light deflection in a very small space, instead of electron beam deflection scan image converter tube and opto-mechanical scanner, cancel the complicated mechanical components, use the all-optical scanning to realize the super fast phenomenon observation. The beam deflection system is based on semiconductor optical waveguide core layer carrier induced refractive index change effect to realize, its development work is mainly divided into semiconductor optical waveguide and saw prisms two parts. And through the experiment, we measured deflection angle of the scanner chip to 1053nm signal light.

Optical beam deflection signal from a single microparticle

1990 ◽  
Vol 57 (1) ◽  
pp. 22-24 ◽  
Author(s):  
Jiaqi Wu ◽  
Takehiko Kitamori ◽  
Tsuguo Sawada
Keyword(s):  
Optical Beam ◽  
Beam Deflection

Optical beam deflection imaging of the electron beam interaction volume in semiconductors

1993 ◽  
Vol 63 (5) ◽  
pp. 645-647 ◽  
Author(s):  
G. Y. Chang ◽  
R. B. Givens ◽  
J. W. M. Spicer ◽  
R. Osiander ◽  
J. C. Murphy
Keyword(s):  
Electron Beam ◽  
Optical Beam ◽  
Beam Deflection ◽  
Interaction Volume ◽  
Beam Interaction
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