A two-axis in-plane motion measurement system based on optical beam deflection

2013 ◽  
Vol 84 (10) ◽  
pp. 105001 ◽  
Author(s):  
R. Sriramshankar ◽  
R. Sri Muthu Mrinalini ◽  
G. R. Jayanth
Keyword(s):  
Measurement System ◽  
Plane Motion ◽  
Optical Beam ◽  
Beam Deflection ◽  
Motion Measurement

Systematic characterization of optical beam deflection measurement system for micro and nanomechanical systems

Measurement ◽  
2014 ◽  
Vol 56 ◽  
pp. 104-116 ◽  
Author(s):  
R.W. Herfst ◽  
W.A. Klop ◽  
M. Eschen ◽  
T.C. van den Dool ◽  
N.B. Koster ◽  
...  
Keyword(s):  
Measurement System ◽  
Optical Beam ◽  
Beam Deflection ◽  
Deflection Measurement ◽  
Nanomechanical Systems

Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams

2013 ◽  
Vol 84 (8) ◽  
pp. 083701 ◽  
Author(s):  
Eika Tsunemi ◽  
Kei Kobayashi ◽  
Noriaki Oyabu ◽  
Masaharu Hirose ◽  
Yoshiko Takenaka ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Laser Beams ◽  
Beam Deflection ◽  
Incident Laser ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dual Probe

Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method

2007 ◽  
Vol 46 (8B) ◽  
pp. 5636-5638 ◽  
Author(s):  
Eika Tsunemi ◽  
Nobuo Satoh ◽  
Yuji Miyato ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Atomic Force

SHIP MOTION MEASUREMENT SYSTEM AROUND OFFSHORE STRUCTURE BY USING MONOCULAR VISION

2021 ◽  
Vol 77 (2) ◽  
pp. I_655-I_660
Author(s):  
Wataru MOCHIZUKI ◽  
Mao KONOSU ◽  
Tsuyoshi IKEYA ◽  
Daisuke INAZU ◽  
Akio OKAYASU
Keyword(s):  
Measurement System ◽  
Monocular Vision ◽  
Ship Motion ◽  
Offshore Structure ◽  
Motion Measurement

Optical beam deflection signal from a single microparticle

1990 ◽  
Vol 57 (1) ◽  
pp. 22-24 ◽  
Author(s):  
Jiaqi Wu ◽  
Takehiko Kitamori ◽  
Tsuguo Sawada
Keyword(s):  
Optical Beam ◽  
Beam Deflection
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