Effects of vacuum-ultraviolet irradiation on copper penetration into low-k dielectrics under bias-temperature stress
Keyword(s):
2017 ◽
Vol 35
(2)
◽
pp. 021509
◽
2011 ◽
Vol 29
(1)
◽
pp. 010601
◽
Keyword(s):
2003 ◽
Vol 42
(Part 2, No. 8A)
◽
pp. L910-L913
◽
Keyword(s):
2011 ◽
Vol 51
(8)
◽
pp. 1342-1345
◽