scholarly journals Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy

2014 ◽  
Vol 116 (6) ◽  
pp. 066815 ◽  
Author(s):  
Michele Manzo ◽  
Denise Denning ◽  
Brian J. Rodriguez ◽  
Katia Gallo
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Β Phase ◽  
Nanoscale Characterization

Characterization of Nanomechanical, Ferroelectric, and Piezoelectric Properties by Nanoindentation and Piezoresponse Force Microscopy of PbTiO3 Thin Films

2013 ◽  
Vol 52 (40) ◽  
pp. 14328-14334 ◽  
Author(s):  
Juan Ramos-Cano ◽  
Mario Miki-Yoshida ◽  
André Marino Gonçalves ◽  
José Antônio Eiras ◽  
Jesús González-Hernández ◽  
...  
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Ferroelectric And Piezoelectric Properties

scholarly journals Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1142 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemi ◽  
Pascal Carriere ◽  
Sonil Nanda ◽  
Aymen Amine Assadi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Characterization ◽  
Super Resolution ◽  
Polymeric Materials ◽  
Polymer Materials ◽  
Polymer Science ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

Shape and size of epididymal sperm from Gir bulls using atomic force microscopy: A nanoscale characterization of epididymal sperm

2020 ◽  
Vol 20 (1) ◽  
pp. 37-41
Author(s):  
Andrielle Thainar Mendes Cunha ◽  
Luciano Paulino Silva ◽  
José Oliveira Carvalho ◽  
Margot Alves Nunes Dode
Keyword(s):  
Atomic Force Microscopy ◽  
Epididymal Sperm ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization ◽  
Shape And Size

scholarly journals Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy

2019 ◽  
Vol 475 (2223) ◽  
pp. 20180782 ◽  
Author(s):  
Hana Uršič ◽  
Uroš Prah
Keyword(s):  
Domain Walls ◽  
Thick Films ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Domain Structures ◽  
Atomic Force ◽  
Ferroelectric Domain Structure ◽  
Converse Piezoelectric Effect ◽  
Non Destructive

In recent years, ferroelectric/piezoelectric polycrystalline bulks and thick films have been extensively studied for different applications, such as sensors, actuators, transducers and caloric devices. In the majority of these applications, the electric field is applied to the working element in order to induce an electromechanical response, which is a complex phenomenon with several origins. Among them is the field-induced movement of domain walls, which is nowadays extensively studied using piezoresponse force microscopy (PFM), a technique derived from atomic force microscopy. PFM is based on the detection of the local converse piezoelectric effect in the sample; it is one of the most frequently applied methods for the characterization of the ferroelectric domain structure due to the simplicity of the sample preparation, its non-destructive nature and its relatively high imaging resolution. In this review, we focus on the PFM analysis of ferroelectric bulk ceramics and thick films. The core of the paper is divided into four sections: (i) introduction; (ii) the preparation of the samples prior to the PFM investigation; (iii) this is followed by reviews of the domain structures in polycrystalline bulks; and (iv) thick films.

Direct characterization of nanoscale domain switching and local piezoelectric loops of (Pb,La)TiO3 thin films by piezoresponse force microscopy

2005 ◽  
Vol 81 (6) ◽  
pp. 1207-1212 ◽  
Author(s):  
R. Poyato ◽  
M.L. Calzada ◽  
V.V. Shvartsman ◽  
A. Kholkin ◽  
P. Vilarinho ◽  
...  
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy

Nanoscale characterization of copper oxide films by Kelvin Probe Force Microscopy

2015 ◽  
Vol 584 ◽  
pp. 310-315 ◽  
Author(s):  
Tobias Berthold ◽  
Guenther Benstetter ◽  
Werner Frammelsberger ◽  
Rosana Rodríguez ◽  
Montserrat Nafría
Keyword(s):  
Copper Oxide ◽  
Oxide Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Nanoscale Characterization
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