scholarly journals Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1142 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemi ◽  
Pascal Carriere ◽  
Sonil Nanda ◽  
Aymen Amine Assadi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Characterization ◽  
Super Resolution ◽  
Polymeric Materials ◽  
Polymer Materials ◽  
Polymer Science ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

scholarly journals Recent Progressive Use of Advanced Atomic Force Microscopy in Polymer Science: A Review

2020 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemin ◽  
Pascal Carriere ◽  
Aymen Amine Assadi ◽  
Dinh Duc Nguyen
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Characterization ◽  
Super Resolution ◽  
Polymeric Materials ◽  
Polymer Materials ◽  
Polymer Science ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. In this perspective paper, we review recent progress in the use of AFM-IR in polymer science. We describe first the principle of AFM-IR and the recent improvements to enhance its resolution. We discuss then the last progress in the use of AFM-IR as a super-resolution correlated scanned-probe IR spectroscopy for chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers and biopolymers. To highlight the advantages of AFM-IR, we report here several results in studying crystallization of both miscible and immiscible blends as well as polymer aging. Then, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure and crystallization mechanisms at the nanoscale, which have never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

The Application of Atomic Force Microscopy to the Characterization of Industrial Polymer Materials

MRS Bulletin ◽  
2004 ◽  
Vol 29 (7) ◽  
pp. 464-470 ◽  
Author(s):  
Georg K. Bar ◽  
Gregory F. Meyers
Keyword(s):  
Atomic Force Microscopy ◽  
Polymeric Materials ◽  
Porous Polymer ◽  
Polymer Materials ◽  
Phase Imaging ◽  
Structure Property ◽  
Polymer Systems ◽  
Force Microscopy ◽  
Atomic Force

AbstractAtomic force microscopy (AFM) is now well established among the tools of choice for the analysis and characterization of materials.Applications of AFM span many industries including chemicals, plastics, pharmaceuticals, and semiconductors.Advancements in AFM instrumentation over the last five years have expanded the range of application of this technology to investigate thermal and mechanical properties of complex materials at high spatial resolution as well as structural and morphological characterization of materials subjected to thermal and mechanical stresses.In particular, this has been an enabling technology for an improved understanding of structure–property relationships in polymeric materials including homopolymers, blends, impact-modified polymer systems, porous polymer systems, and semicrystalline polymers.Practical examples illustrate applications of contact, tapping-mode, phase-imaging, hot-stage, and scanning thermal methods for the characterization of modern industrial polymer materials.

Shape and size of epididymal sperm from Gir bulls using atomic force microscopy: A nanoscale characterization of epididymal sperm

2020 ◽  
Vol 20 (1) ◽  
pp. 37-41
Author(s):  
Andrielle Thainar Mendes Cunha ◽  
Luciano Paulino Silva ◽  
José Oliveira Carvalho ◽  
Margot Alves Nunes Dode
Keyword(s):  
Atomic Force Microscopy ◽  
Epididymal Sperm ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization ◽  
Shape And Size

scholarly journals Nanoscale characterization of squaraine-fullerene-based photovoltaic active layers by atomic force microscopy mechanical and electrical property mapping

2019 ◽  
Vol 669 ◽  
pp. 120-132 ◽  
Author(s):  
Tonya Coffey ◽  
Andrew Seredinski ◽  
Jake N. Poler ◽  
Crystal Patteson ◽  
William H. Watts ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Property ◽  
Force Microscopy ◽  
Active Layers ◽  
Atomic Force ◽  
Nanoscale Characterization

scholarly journals Nanoscale characterization of all-oxide core-shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods

2021 ◽  
Author(s):  
Illia Dobryden ◽  
Riccardo Borgani ◽  
Federica Rigoni ◽  
Pedram Ghamgosar ◽  
Isabella Concina ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Contact Potential Difference ◽  
Core Shell ◽  
Contact Potential ◽  
Distribution Maps ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

The electrical properties of an all-oxide core-shell ZnO-Co3O4 nanorod heterojunction were studied in dark and under UV-vis illumination. The contact potential difference and current distribution maps were obtained utilizing new...

Sign in / Sign up

Export Citation Format

Share Document