scholarly journals Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm

2014 ◽  
Vol 85 (6) ◽  
pp. 066101 ◽  
Author(s):  
Peng Huang ◽  
Sean B. Andersson
Keyword(s):  
Atomic Force Microscopy ◽  
Fast Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Raster Scan

scholarly journals High-stroke silicon-on-insulator MEMS nanopositioner: Control design for non-raster scan atomic force microscopy

2015 ◽  
Vol 86 (2) ◽  
pp. 023705 ◽  
Author(s):  
Mohammad Maroufi ◽  
Anthony G. Fowler ◽  
Ali Bazaei ◽  
S. O. Reza Moheimani
Keyword(s):  
Atomic Force Microscopy ◽  
Control Design ◽  
Silicon On Insulator ◽  
Force Microscopy ◽  
Atomic Force ◽  
Raster Scan

Combining Fast Imaging and Variable Temperature Studies in Atomic Force Microscopy

MRS Advances ◽  
2018 ◽  
Vol 3 (44) ◽  
pp. 2705-2712
Author(s):  
Sergei Magonov ◽  
Shijie Wu
Keyword(s):  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Fast Imaging ◽  
Low Density Polyethylene ◽  
Structural Transitions ◽  
Heating Rates ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials ◽  
Ethylene Octene Copolymer

AbstractFast imaging in Atomic Force Microscopy enhances the capability of studying phase transitions and surface properties of materials at variable temperatures. This is demonstrated by measurements of several polymers [poly(diethylsiloxane), low-density polyethylene and ethylene-octene copolymer] and bitumen at low (down to -20°C) and high (up to +150°C) temperatures. Monitoring of structural transitions was performed at small and large (up to 40 μm) areas with 1-5°C/min cooling/heating rates. Novel data about dynamics and structural transitions of mesomorphic transitions and crystallization were obtained.

Implementation of a Sinusoidal Raster Scan for High-Speed Atomic Force Microscopy

2020 ◽  
Vol 77 (7) ◽  
pp. 605-612
Author(s):  
Luke Oduor Otieno ◽  
Yong Joong Lee ◽  
Bernard Ouma Alunda
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Force Microscopy ◽  
Atomic Force ◽  
Raster Scan

Fast imaging with alternative signal for dynamic atomic force microscopy

2010 ◽  
Vol 97 (13) ◽  
pp. 133101 ◽  
Author(s):  
Chibum Lee ◽  
Srinivasa M. Salapaka
Keyword(s):  
Atomic Force Microscopy ◽  
Fast Imaging ◽  
Force Microscopy ◽  
Atomic Force
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