Fast imaging with alternative signal for dynamic atomic force microscopy

2010 ◽  
Vol 97 (13) ◽  
pp. 133101 ◽  
Author(s):  
Chibum Lee ◽  
Srinivasa M. Salapaka
Keyword(s):  
Atomic Force Microscopy ◽  
Fast Imaging ◽  
Force Microscopy ◽  
Atomic Force

Combining Fast Imaging and Variable Temperature Studies in Atomic Force Microscopy

MRS Advances ◽  
2018 ◽  
Vol 3 (44) ◽  
pp. 2705-2712
Author(s):  
Sergei Magonov ◽  
Shijie Wu
Keyword(s):  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Fast Imaging ◽  
Low Density Polyethylene ◽  
Structural Transitions ◽  
Heating Rates ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials ◽  
Ethylene Octene Copolymer

AbstractFast imaging in Atomic Force Microscopy enhances the capability of studying phase transitions and surface properties of materials at variable temperatures. This is demonstrated by measurements of several polymers [poly(diethylsiloxane), low-density polyethylene and ethylene-octene copolymer] and bitumen at low (down to -20°C) and high (up to +150°C) temperatures. Monitoring of structural transitions was performed at small and large (up to 40 μm) areas with 1-5°C/min cooling/heating rates. Novel data about dynamics and structural transitions of mesomorphic transitions and crystallization were obtained.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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