Combining Fast Imaging and Variable Temperature Studies in Atomic Force Microscopy

MRS Advances ◽  
2018 ◽  
Vol 3 (44) ◽  
pp. 2705-2712
Author(s):  
Sergei Magonov ◽  
Shijie Wu
Keyword(s):  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Fast Imaging ◽  
Low Density Polyethylene ◽  
Structural Transitions ◽  
Heating Rates ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials ◽  
Ethylene Octene Copolymer

AbstractFast imaging in Atomic Force Microscopy enhances the capability of studying phase transitions and surface properties of materials at variable temperatures. This is demonstrated by measurements of several polymers [poly(diethylsiloxane), low-density polyethylene and ethylene-octene copolymer] and bitumen at low (down to -20°C) and high (up to +150°C) temperatures. Monitoring of structural transitions was performed at small and large (up to 40 μm) areas with 1-5°C/min cooling/heating rates. Novel data about dynamics and structural transitions of mesomorphic transitions and crystallization were obtained.

REAL-TIME VISUALIZATION OF MORPHOLOGICAL EVOLUTION OF N, N'-di(naphthalene-1-yl)-N, N'-diphthalbenzidine THIN FILMS: VARIABLE TEMPERATURE ATOMIC FORCE MICROSCOPY STUDY

2002 ◽  
Vol 01 (05n06) ◽  
pp. 725-730 ◽  
Author(s):  
M. S. XU ◽  
J. B. XU ◽  
J. AN
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Morphological Evolution ◽  
Variable Temperature ◽  
Glassy State ◽  
Microscopy Study ◽  
Light Emitting ◽  
Force Microscopy ◽  
Atomic Force ◽  
Real Time Visualization

Variable temperature tapping mode atomic force microscopy is exploited to in situ visualize the morphological evolution of N, N'-di(naphthalene-1-yl)-N, N'-diphthalbenzidine (NPB) thin film. The apparent glass transition of the NPB thin film initially occurred at 60°C, proceeded until 95°C, and crystallization from the glassy state quickly appeared at 135°C. The NPB thin film gradually melted and disappeared when the temperature was above 175°C, revealing the underlying layer. These observations are technically helpful and significant to gauge the temperature dependent lifetime and luminance of organic light-emitting diodes.

Using Atomic Force Microscopy to Retrieve Nanomechanical Surface Properties of Materials

2006 ◽  
Vol 514-516 ◽  
pp. 1598-1602 ◽  
Author(s):  
Sergio Graça ◽  
Rogerio Colaço ◽  
Rui Vilar
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Application Rate ◽  
Critical Parameters ◽  
Nanomechanical Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials ◽  
Microscopy Techniques ◽  
Scratch Tests

When atomic force microscopy is used to retrieve nanomechanical surface properties of materials, unsuspected measurement and instrumentation errors may occur. In this work, some error sources are investigated and operating and correction procedures are proposed in order to maximize the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular the creep of the z-piezo, and errors in the determination of the real dimensions of tested areas, are critical parameters to be considered. However, it was observed that there is a critical load application rate, above which the influence of the creep of the z-piezo can be neglected. Also, it was observed that deconvolution of the tip geometry from the image of the tested area is essential to obtain accurate values of the dimensions of indentations and scratches. The application of these procedures enables minimizing the errors in nanomechanical property measurements using atomic force microscopy techniques.

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

scholarly journals Contact resonance atomic force microscopy for viscoelastic characterization of polymer-based nanocomposites at variable temperature

2016 ◽  
Author(s):  
Marco Natali ◽  
Daniele Passeri ◽  
Melania Reggente ◽  
Emanuela Tamburri ◽  
Maria Letizia Terranova ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance

scholarly journals Harnessing the damping properties of materials for high-speed atomic force microscopy

2015 ◽  
Vol 11 (2) ◽  
pp. 147-151 ◽  
Author(s):  
Jonathan D. Adams ◽  
Blake W. Erickson ◽  
Jonas Grossenbacher ◽  
Juergen Brugger ◽  
Adrian Nievergelt ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Damping Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials
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