scholarly journals Drop splashing on a rough surface: How surface morphology affects splashing threshold

2014 ◽  
Vol 104 (16) ◽  
pp. 161608 ◽  
Author(s):  
Hyungmo Kim ◽  
Usung Park ◽  
Chan Lee ◽  
Hyungdae Kim ◽  
Moo Hwan Kim ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Rough Surface

Morphology of instability of the wetting tips of eutectic SnBi, eutectic SnPb, and pure Sn on Cu

1995 ◽  
Vol 10 (3) ◽  
pp. 497-504 ◽  
Author(s):  
H.K. Kim ◽  
H.K. Liou ◽  
K.N. Tu
Keyword(s):  
Solder Joint ◽  
Surface Morphology ◽  
Intermetallic Compounds ◽  
Rough Surface ◽  
Environmental Issue ◽  
Wetting Angle ◽  
Angle Change ◽  
Microelectronics Industry ◽  
Pure Sn ◽  
Eutectic Snpb

The Pb-based solder used in microelectronics industry is becoming an environmental issue. To understand the wetting behavior of solders with and without Pb, we have studied the surface morphology and wetting reaction of eutectic SnBi, eutectic SnPb, and pure Sn on Cu through the measurements of wetting angle change and wetting tip stability by SEM and EDX. The wetting angle remains constant after the initial spread, but the eutectic SnPb/Cu continues to react and forms a reaction band in front of the solder edge as well as intermetallic compounds at the interface. For eutectic SnBi/Cu, there is no reaction at the wetting tip, and the wetting angle does not change much; however, the interfacial reaction between eutectic SnBi and Cu forms intermetallic compounds at the solder joint; the wetting tip is not in a static equilibrium. A rough surface and edge was observed on the eutectic SnBi/Cu joint, but the eutectic SnPb/Cu has a smoother surface and edge.

Ion Bombardment Effect on the Properties of a-Si:H

1984 ◽  
Vol 38 ◽  
Author(s):  
B. Drevillon ◽  
J. P. M. Schmitt
Keyword(s):  
Surface Morphology ◽  
Hydrogen Evolution ◽  
Rough Surface ◽  
Spectroscopic Ellipsometry ◽  
Film Growth ◽  
Ion Bombardment ◽  
Sharp Interface ◽  
Charged Species ◽  
Amorphous Network ◽  
Moderate Energy

AbstractIn a low pressure multipole plasma, the energy of the charged species impinging on the substrate can be varied electrostatically. Spectroscopic ellipsometry is used to study the film growth and the surface morphology. Hydrogen evolution is used to investigate the release of hydrogen from the amorphous network. Moderate energy ion bombardment (Eion ‰ 50 eV) is shown to favour the formation of homogeneous high density films with a sharp interface. Weak ion bombardment (Eion ‰ 20 eV) results in a microscopically rough surface. The material strucbural variations are evidenced by hydrogen evolution kinetics.

An Established Epithelial Cell Line (NPC/HK1) from a Nasopharyngeal Carcinoma - II. A Sem Study

1982 ◽  
Vol 40 ◽  
pp. 224-225
Author(s):  
Li C.L. ◽  
Chew E.C. ◽  
Huang D.P. ◽  
Ho H.C. ◽  
Mak L.S. ◽  
...  
Keyword(s):  
Nasopharyngeal Carcinoma ◽  
Epithelial Cell ◽  
Surface Morphology ◽  
Cell Line ◽  
Epithelial Cell Line ◽  
Present Communication ◽  
Cells In Culture ◽  
Sem Study ◽  
Well Differentiated

An epithelial cell line, NPC/HK1, has recently been successfully established from a nasopharyngeal carcinoma of the moderately to well differentiated squamous type. The present communication reports on the surface morphology of the NPC/HK1 cells in culture.

Specimen Collection Effect in Scanning Electron Microscopy Images

1972 ◽  
Vol 30 ◽  
pp. 448-449
Author(s):  
J. Temple Black ◽  
Jose Guerrero
Keyword(s):  
Surface Morphology ◽  
Secondary Electron Emission ◽  
Secondary Electrons ◽  
Charge Effects ◽  
Material Density ◽  
Specimen Collection ◽  
The Subject ◽  
Curved Paths ◽  
Subject Material ◽  
Microscopy Images

In the SEM, contrast in the image is the result of variations in the volume secondary electron emission and backscatter emission which reaches the detector and serves to intensity modulate the signal for the CRT's. This emission is a function of the accelerating potential, material density, chemistry, crystallography, local charge effects, surface morphology and especially the angle of the incident electron beam with the particular surface site. Aside from the influence of object inclination, the surface morphology is the most important feature In producing contrast. “Specimen collection“ is the name given the shielding of the collector by adjacent parts of the specimen, producing much image contrast. This type of contrast can occur for both secondary and backscatter electrons even though the secondary electrons take curved paths to the detector-collector.Figure 1 demonstrates, in a unique and striking fashion, the specimen collection effect. The subject material here is Armco Iron, 99.85% purity, which was spark machined.

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