Wake-up effects in Si-doped hafnium oxide ferroelectric thin films

2013 ◽  
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U. Schröder

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Xing Chen ◽  
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Jun Qin ◽  
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We report a systematic study of the fatigue mechanism of yttrium-doped hafnium oxide (HYO) ferroelectric thin films deposited by pulsed laser deposition.


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