Rapid preparation of electron beam induced deposition Co magnetic force microscopy tips with 10 nm spatial resolution

2012 ◽  
Vol 83 (9) ◽  
pp. 093711 ◽  
Author(s):  
L. M. Belova ◽  
Olav Hellwig ◽  
Elizabeth Dobisz ◽  
E. Dan Dahlberg
Keyword(s):  
Electron Beam ◽  
Spatial Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Rapid Preparation ◽  
Force Microscopy ◽  
Electron Beam Induced Deposition

scholarly journals Customized MFM probes based on magnetic nanorods

Nanoscale ◽  
2020 ◽  
Vol 12 (18) ◽  
pp. 10090-10097 ◽  
Author(s):  
Miriam Jaafar ◽  
Javier Pablo-Navarro ◽  
Eider Berganza ◽  
Pablo Ares ◽  
César Magén ◽  
...  
Keyword(s):  
Electron Beam ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Magnetic Nanorods ◽  
Electron Beam Induced Deposition

Focused Electron Beam Induced Deposition (FEBID) for magnetic tip fabrication is presented in this work as an alternative to conventional sputtering-based Magnetic Force Microscopy (MFM) tips.

Improved spatial resolution in magnetic force microscopy

1997 ◽  
Vol 71 (22) ◽  
pp. 3293-3295 ◽  
Author(s):  
George D. Skidmore ◽  
E. Dan Dahlberg
Keyword(s):  
Spatial Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

scholarly journals Magnetic force microscopy using electron‐beam fabricated tips

1994 ◽  
Vol 65 (10) ◽  
pp. 3224-3228 ◽  
Author(s):  
M. Rührig ◽  
S. Porthun ◽  
J. C. Lodder
Keyword(s):  
Electron Beam ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

scholarly journals Electron beam fabrication and characterization of high‐resolution magnetic force microscopy tips

1996 ◽  
Vol 79 (6) ◽  
pp. 2913-2919 ◽  
Author(s):  
M. Rührig ◽  
S. Porthun ◽  
J. C. Lodder ◽  
S. McVitie ◽  
L. J. Heyderman ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Fabrication And Characterization

Investigation of Spatial Resolution in Current-Induced Magnetic Field Detection by Magnetic Force Microscopy

2005 ◽  
Vol 44 (12) ◽  
pp. 8625-8629 ◽  
Author(s):  
Daisuke Saida ◽  
Tomohiko Edura ◽  
Ken Tsutsui ◽  
Yasuo Wada ◽  
Takuji Takahashi
Keyword(s):  
Magnetic Field ◽  
Spatial Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Induced Magnetic Field ◽  
Field Detection ◽  
Force Microscopy

Study of MFM Application in Semiconductor Failure Analysis

2004 ◽  
Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Current Flow ◽  
Force Microscopy ◽  
The Magnetic Field ◽  
A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

scholarly journals Magnetic Force Microscopy: Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes (Small 11/2020)

Small ◽  
2020 ◽  
Vol 16 (11) ◽  
pp. 2070058
Author(s):  
Héctor Corte‐León ◽  
Volker Neu ◽  
Alessandra Manzin ◽  
Craig Barton ◽  
Yuanjun Tang ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

Magnetic Domain Observation on Melt-Spun Nd-Fe-B Ribbons Using Magnetic Force Microscopy

1999 ◽  
Vol 577 ◽  
Author(s):  
A. Gavrin ◽  
C. Sellers ◽  
S.H. Liouw
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Measurements ◽  
Magnetic Domain ◽  
Domain Size ◽  
High Coercivity ◽  
Uniform Domain ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Melt Spun

ABSTRACTWe have used Magnetic Force Microscopy (MFM) to study the magnetic domain structures of melt-spun Nd-Fe-B ribbons. The ribbons are commercial products (Magnequench International, Inc. MQP-B and MQP-B+) with a thickness of approximately 20 microns. These materials have identical composition, Nd12.18B5.36Fe76.99Co5.46, but differ in quenching conditions. In order to study the distribution of domain sizes through the ribbon thickness, we have prepared cross-sectional samples in epoxy mounts. In order to avoid artifacts due to tip-sample interactions, we have used high coercivity CoPt coated MFM tips. Our studies show domain sizes typically ranging from 50-200 nm in diameter. This is in agreement with studies of similar materials in which domains were investigated in the plane of the ribbon. We also find that these products differ substantially in mean domain size and in the uniformity of the domain sizes as measured across the ribbon. While the B+ material shows nearly uniform domain sizes throughout the cross section, the B material shows considerably larger domains on one surface, followed by a region in which the domains are smaller than average. This structure is presumably due to the differing quench conditions. The region of coarse domains varies in thickness, disappearing in some areas, and reaching a maximum thickness of 2.75 µm in others. We also describe bulk magnetic measurements, and suggest that.

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