Customized MFM probes based on magnetic nanorods
Keyword(s):
Focused Electron Beam Induced Deposition (FEBID) for magnetic tip fabrication is presented in this work as an alternative to conventional sputtering-based Magnetic Force Microscopy (MFM) tips.
2012 ◽
Vol 83
(9)
◽
pp. 093711
◽
1994 ◽
Vol 65
(10)
◽
pp. 3224-3228
◽
Keyword(s):
Keyword(s):
Keyword(s):
1991 ◽
Vol 27
(6)
◽
pp. 5181-5183
◽
1995 ◽
Vol 31
(6)
◽
pp. 3349-3351
◽
Keyword(s):