scholarly journals Electron beam fabrication and characterization of high‐resolution magnetic force microscopy tips

1996 ◽  
Vol 79 (6) ◽  
pp. 2913-2919 ◽  
Author(s):  
M. Rührig ◽  
S. Porthun ◽  
J. C. Lodder ◽  
S. McVitie ◽  
L. J. Heyderman ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Fabrication And Characterization

A comparison of domain images obtained for nanophase alloys by magnetic force microscopy and high resolution Lorentz electron microscopy

1995 ◽  
Vol 31 (6) ◽  
pp. 3349-3351 ◽  
Author(s):  
M.R.J. Gibbs ◽  
M.A. Al-Khafaji ◽  
W.M. Rainforth ◽  
H.A. Davies ◽  
K. Babcock ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

Fabrication of Magnetic Tips for High-Resolution Magnetic Force Microscopy

2013 ◽  
Vol 543 ◽  
pp. 35-38 ◽  
Author(s):  
Masaaki Futamoto ◽  
Tatsuya Hagami ◽  
Shinji Ishihara ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake
Keyword(s):  
Magnetic Material ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Force Microscopy ◽  
High Magnetic Moment ◽  
Tip Radius ◽  
Better Than ◽  
Sputtering System

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.

scholarly journals High resolution magnetic force microscopy using focused ion beam modified tips

2002 ◽  
Vol 81 (5) ◽  
pp. 865-867 ◽  
Author(s):  
G. N. Phillips ◽  
M. Siekman ◽  
L. Abelmann ◽  
J. C. Lodder
Keyword(s):  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Force Microscopy

Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields

2008 ◽  
Vol 104 (12) ◽  
pp. 123503 ◽  
Author(s):  
Tanja Weis ◽  
Ingo Krug ◽  
Dieter Engel ◽  
Arno Ehresmann ◽  
Volker Höink ◽  
...  
Keyword(s):  
Magnetic Fields ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

scholarly journals Local characterization of a heavy-fermion superconductor via sub-Kelvin magnetic force microscopy

2020 ◽  
Vol 117 (25) ◽  
pp. 252601
Author(s):  
Dirk Wulferding ◽  
Geunyong Kim ◽  
Hoon Kim ◽  
Ilkyu Yang ◽  
E. D. Bauer ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Heavy Fermion ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Local Characterization ◽  
Heavy Fermion Superconductor

scholarly journals Magnetic force microscopy characterization of cobalt nanoparticles: A preliminary study

2020 ◽  
Author(s):  
Livia Angeloni ◽  
Daniele Passeri ◽  
Pier Giorgio Schiavi ◽  
Francesca Pagnanelli ◽  
Marco Rossi
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Cobalt Nanoparticles ◽  
Force Microscopy ◽  
Preliminary Study ◽  
Microscopy Characterization
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