Influence of magnetic material composition of Fe100−xBx coated tip on the spatial resolution of magnetic force microscopy

2012 ◽  
Vol 111 (7) ◽  
pp. 07E339 ◽  
Keyword(s):  
Magnetic Material ◽  
Spatial Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Material Composition ◽  
Force Microscopy

Fabrication of Magnetic Tips for High-Resolution Magnetic Force Microscopy

2013 ◽  
Vol 543 ◽  
pp. 35-38 ◽  
Author(s):  
Masaaki Futamoto ◽  
Tatsuya Hagami ◽  
Shinji Ishihara ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake
Keyword(s):  
Magnetic Material ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Force Microscopy ◽  
High Magnetic Moment ◽  
Tip Radius ◽  
Better Than ◽  
Sputtering System

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.

Improved spatial resolution in magnetic force microscopy

1997 ◽  
Vol 71 (22) ◽  
pp. 3293-3295 ◽  
Author(s):  
George D. Skidmore ◽  
E. Dan Dahlberg
Keyword(s):  
Spatial Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

Investigation of Spatial Resolution in Current-Induced Magnetic Field Detection by Magnetic Force Microscopy

2005 ◽  
Vol 44 (12) ◽  
pp. 8625-8629 ◽  
Author(s):  
Daisuke Saida ◽  
Tomohiko Edura ◽  
Ken Tsutsui ◽  
Yasuo Wada ◽  
Takuji Takahashi
Keyword(s):  
Magnetic Field ◽  
Spatial Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Induced Magnetic Field ◽  
Field Detection ◽  
Force Microscopy

Study of MFM Application in Semiconductor Failure Analysis

2004 ◽  
Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Current Flow ◽  
Force Microscopy ◽  
The Magnetic Field ◽  
A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

scholarly journals Magnetic Force Microscopy: Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes (Small 11/2020)

Small ◽  
2020 ◽  
Vol 16 (11) ◽  
pp. 2070058
Author(s):  
Héctor Corte‐León ◽  
Volker Neu ◽  
Alessandra Manzin ◽  
Craig Barton ◽  
Yuanjun Tang ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy
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