Near-field focused photoemission from polystyrene microspheres studied with photoemission electron microscopy

2012 ◽  
Vol 137 (1) ◽  
pp. 014202 ◽  
Author(s):  
Samuel J. Peppernick ◽  
Alan G. Joly ◽  
Kenneth M. Beck ◽  
Wayne P. Hess
Keyword(s):  
Electron Microscopy ◽  
Near Field ◽  
Polystyrene Microspheres ◽  
Photoemission Electron Microscopy ◽  
Photoemission Electron

scholarly journals Exploring Coupled Plasmonic Nanostructures in the Near Field by Photoemission Electron Microscopy

ACS Nano ◽  
2016 ◽  
Vol 10 (11) ◽  
pp. 10373-10381 ◽  
Author(s):  
Han Yu ◽  
Quan Sun ◽  
Kosei Ueno ◽  
Tomoya Oshikiri ◽  
Atsushi Kubo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Near Field ◽  
Plasmonic Nanostructures ◽  
Photoemission Electron Microscopy ◽  
Photoemission Electron

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

scholarly journals Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors

2017 ◽  
Vol 23 (S1) ◽  
pp. 1504-1505
Author(s):  
Taisuke Ohta ◽  
Morgann Berg ◽  
Kunttal Keyshar ◽  
Jason M. Kephart ◽  
Thomas E. Beechem ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electronic Properties ◽  
Photoemission Electron Microscopy ◽  
2D Crystals ◽  
Photoemission Electron

scholarly journals Enabling Photoemission Electron Microscopy in Liquids via Graphene-Capped Microchannel Arrays

Nano Letters ◽  
2017 ◽  
Vol 17 (2) ◽  
pp. 1034-1041 ◽  
Author(s):  
Hongxuan Guo ◽  
Evgheni Strelcov ◽  
Alexander Yulaev ◽  
Jian Wang ◽  
Narayana Appathurai ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoemission Electron Microscopy ◽  
Microchannel Arrays ◽  
Photoemission Electron

High resolution scanning near field mapping of enhancement on SERS substrates: comparison with photoemission electron microscopy

2016 ◽  
Vol 18 (14) ◽  
pp. 9405-9411 ◽  
Author(s):  
C. Awada ◽  
J. Plathier ◽  
C. Dab ◽  
F. Charra ◽  
L. Douillard ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Near Field ◽  
Spectroscopic Technique ◽  
Proof Of Concept ◽  
Sers Substrates ◽  
Surface Enhanced ◽  
Surface Enhanced Raman ◽  
Enhanced Raman Scattering ◽  
Photoemission Electron

The need for a dedicated spectroscopic technique with nanoscale resolution to characterize SERS substrates pushed us to develop a proof of concept of a functionalized tip–surface enhanced Raman scattering (FTERS) technique.

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