High resolution scanning near field mapping of enhancement on SERS substrates: comparison with photoemission electron microscopy
2016 ◽
Vol 18
(14)
◽
pp. 9405-9411
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Keyword(s):
The need for a dedicated spectroscopic technique with nanoscale resolution to characterize SERS substrates pushed us to develop a proof of concept of a functionalized tip–surface enhanced Raman scattering (FTERS) technique.
2019 ◽
Vol 537
◽
pp. 536-546
◽
2011 ◽
Vol 2011
◽
pp. 1-9
◽
2018 ◽
Vol 18
(4)
◽
pp. 2803-2810
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