Correlating chemical and electronic states from quantitative photoemission electron microscopy of transition-metal dichalcogenide heterostructures

2021 ◽  
Vol 39 (5) ◽  
pp. 053210
Author(s):  
Olivier Renault ◽  
Hokwon Kim ◽  
Dumitru Dumcenco ◽  
Dmitrii Unuchek ◽  
Nicolas Chevalier ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transition Metal ◽  
Electronic States ◽  
Transition Metal Dichalcogenide ◽  
Photoemission Electron Microscopy ◽  
Photoemission Electron

PEEM AND SXES CHARACTERIZATION ON THE SURFACE AND INTERFACE OF THE TRANSITION-METAL/SiC SYSTEM

2002 ◽  
Vol 09 (01) ◽  
pp. 313-318
Author(s):  
JOSELITO LABIS ◽  
AKIHIKO OHI ◽  
CHIHIRO KAMEZAWA ◽  
TOSHINORI FUJIKI ◽  
KENICHI YOSHIDA ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Heat Treatment ◽  
Transition Metal ◽  
Emission Spectroscopy ◽  
Emission Spectra ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Surface And Interface ◽  
Photoemission Electron

The Si L2,3 and C K soft X-ray emission spectra of the interface of the Ti(50 nm)/4H-SiC(substrate) system, thermally annealed from 800°C to 1000°C and characterized by soft X-ray emission spectroscopy (SXES), revealed the formation of a reacted region composed of silicides with Ti 5 Si 3 as the majority formed species and carbides in TiC-like bonding. Also, the photoemission electron microscopy (PEEM) imaging of Ti(10 nm) film on 3C-SiC surface during in situ heat treatment showed the formation of island structures (in ring clusters) at ~ 800°C.

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

scholarly journals Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors

2017 ◽  
Vol 23 (S1) ◽  
pp. 1504-1505
Author(s):  
Taisuke Ohta ◽  
Morgann Berg ◽  
Kunttal Keyshar ◽  
Jason M. Kephart ◽  
Thomas E. Beechem ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electronic Properties ◽  
Photoemission Electron Microscopy ◽  
2D Crystals ◽  
Photoemission Electron

scholarly journals Enabling Photoemission Electron Microscopy in Liquids via Graphene-Capped Microchannel Arrays

Nano Letters ◽  
2017 ◽  
Vol 17 (2) ◽  
pp. 1034-1041 ◽  
Author(s):  
Hongxuan Guo ◽  
Evgheni Strelcov ◽  
Alexander Yulaev ◽  
Jian Wang ◽  
Narayana Appathurai ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoemission Electron Microscopy ◽  
Microchannel Arrays ◽  
Photoemission Electron
Sign in / Sign up

Export Citation Format

Share Document