The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors

2012 ◽  
Vol 100 (22) ◽  
pp. 222901 ◽  
Author(s):  
Sheng-Yao Huang ◽  
Ting-Chang Chang ◽  
Li-Wei Lin ◽  
Man-Chun Yang ◽  
Min-Chen Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Drain Bias

Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin film transistors under AC gate bias stress

2017 ◽  
Vol 32 (2) ◽  
pp. 91-96
Author(s):  
张猛 ZHANG Meng ◽  
夏之荷 XIA Zhi-he ◽  
周玮 ZHOU Wei ◽  
陈荣盛 CHEN Rong-sheng ◽  
王文 WONG Man ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Silicon Thin Film ◽  
Bias Stress ◽  
Gate Bias Stress

Investigating the Drain-Bias-Induced Degradation Behavior Under Light Illumination for InGaZnO Thin-Film Transistors

2012 ◽  
Vol 33 (7) ◽  
pp. 1000-1002 ◽  
Author(s):  
Tien-Yu Hsieh ◽  
Ting-Chang Chang ◽  
Te-Chih Chen ◽  
Ming-Yen Tsai ◽  
Yu-Te Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Light Illumination ◽  
Degradation Behavior ◽  
Drain Bias

Effect of the Electrode Materials on the Drain-Bias Stress Instabilities of In–Ga–Zn–O Thin-Film Transistors

2012 ◽  
Vol 4 (10) ◽  
pp. 5369-5374 ◽  
Author(s):  
Jun Yong Bak ◽  
Sinhyuk Yang ◽  
Min Ki Ryu ◽  
Sang Hee Ko Park ◽  
Chi Sun Hwang ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Electrode Materials ◽  
Bias Stress ◽  
Drain Bias

Local-Degradation-Induced Threshold Voltage Shift in Turned-OFF Amorphous InGaZnO Thin Film Transistors Under AC Drain Bias Stress

2015 ◽  
Vol 36 (6) ◽  
pp. 579-581 ◽  
Author(s):  
Jong In Kim ◽  
In-Tak Cho ◽  
Chan-Yong Jeong ◽  
Daeun Lee ◽  
Hyuck-In Kwon ◽  
...  
Keyword(s):  
Thin Film ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Threshold Voltage Shift ◽  
Voltage Shift ◽  
Bias Stress ◽  
Drain Bias ◽  
Amorphous Ingazno

Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors

2012 ◽  
Vol 15 (5) ◽  
pp. H161 ◽  
Author(s):  
Sheng-Yao Huang ◽  
Ting-Chang Chang ◽  
Min-Chen Chen ◽  
Shih-Cheng Chen ◽  
Te-Chih Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Effect ◽  
Thin Film Transistors ◽  
Bias Stress ◽  
Drain Bias ◽  
Amorphous Ingazno
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